Measuring conditions for second order X-ray Bragg-spectrometry

dc.bibliographicCitation.firstPage12003eng
dc.bibliographicCitation.issue1eng
dc.bibliographicCitation.lastPage1463eng
dc.bibliographicCitation.volume55eng
dc.contributor.authorDellith, J.
dc.contributor.authorScheffel, A.
dc.contributor.authorWendt, M.
dc.date.accessioned2020-10-28T14:52:52Z
dc.date.available2020-10-28T14:52:52Z
dc.date.issued2014
dc.description.abstractThe KL2,3 (α)1,2-lines of 19K, the L3M4,5 (α)1,2-lines of 48Cd, and the M5N6,7 (α)1,2-lines of 92U are lines of comparable energy in the region of approximately 3 keV. In none of these cases were we able to resolve the three doublets when recording the spectra in first order Bragg spectrometry using a PET crystal as the dispersing element. For the purpose of enhancing the resolving power of the spectrometer, the three α spectra were recorded in second order reflection, thereby transferring the lines into another spectral region dominated by X-ray quanta of half the energy. In order to achieve high net peak intensities as well as a high peak-to-background ratio and, consequently, a high level of detection capability, the discriminator settings should be optimized quite carefully. In this manner, we were able to resolve the three α doublets and estimate α2/α1 intensity ratios. Inexplicably, current monographs, e.g., by Goldstein et al, do not contain any indications about the rational use of high order spectrometry. Only a few rather old monographs contain some hints in this regard.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://doi.org/10.34657/4473
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/5844
dc.language.isoengeng
dc.publisherBristol : Institute of Physics Publishingeng
dc.relation.doihttps://doi.org/10.1088/1757-899X/55/1/012003
dc.relation.ispartofseriesIOP Conference Series: Materials Science and Engineering 55 (2014), Nr. 1eng
dc.relation.issn1757-8981
dc.rights.licenseCC BY 3.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/eng
dc.subjectSpectrometryeng
dc.subjectDetection capabilityeng
dc.subjectIntensity ratioeng
dc.subjectMeasuring conditionseng
dc.subjectPeak intensityeng
dc.subjectPeak-to-background ratioseng
dc.subjectSecond orderseng
dc.subjectSecond-order reflectionseng
dc.subjectSpectral regioneng
dc.subjectX rayseng
dc.subject.classificationKonferenzschriftger
dc.subject.ddc530eng
dc.titleMeasuring conditions for second order X-ray Bragg-spectrometryeng
dc.typearticleeng
dc.typeTexteng
dcterms.bibliographicCitation.journalTitleIOP Conference Series: Materials Science and Engineeringeng
tib.accessRightsopenAccesseng
wgl.contributorIPHTeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
wgl.typeKonferenzbeitrageng
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