Measuring conditions for second order X-ray Bragg-spectrometry
dc.bibliographicCitation.firstPage | 12003 | eng |
dc.bibliographicCitation.issue | 1 | eng |
dc.bibliographicCitation.journalTitle | IOP Conference Series: Materials Science and Engineering | eng |
dc.bibliographicCitation.lastPage | 1463 | eng |
dc.bibliographicCitation.volume | 55 | eng |
dc.contributor.author | Dellith, J. | |
dc.contributor.author | Scheffel, A. | |
dc.contributor.author | Wendt, M. | |
dc.date.accessioned | 2020-10-28T14:52:52Z | |
dc.date.available | 2020-10-28T14:52:52Z | |
dc.date.issued | 2014 | |
dc.description.abstract | The KL2,3 (α)1,2-lines of 19K, the L3M4,5 (α)1,2-lines of 48Cd, and the M5N6,7 (α)1,2-lines of 92U are lines of comparable energy in the region of approximately 3 keV. In none of these cases were we able to resolve the three doublets when recording the spectra in first order Bragg spectrometry using a PET crystal as the dispersing element. For the purpose of enhancing the resolving power of the spectrometer, the three α spectra were recorded in second order reflection, thereby transferring the lines into another spectral region dominated by X-ray quanta of half the energy. In order to achieve high net peak intensities as well as a high peak-to-background ratio and, consequently, a high level of detection capability, the discriminator settings should be optimized quite carefully. In this manner, we were able to resolve the three α doublets and estimate α2/α1 intensity ratios. Inexplicably, current monographs, e.g., by Goldstein et al, do not contain any indications about the rational use of high order spectrometry. Only a few rather old monographs contain some hints in this regard. | eng |
dc.description.version | publishedVersion | eng |
dc.identifier.uri | https://doi.org/10.34657/4473 | |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/5844 | |
dc.language.iso | eng | eng |
dc.publisher | Bristol : Institute of Physics Publishing | eng |
dc.relation.doi | https://doi.org/10.1088/1757-899X/55/1/012003 | |
dc.relation.issn | 1757-8981 | |
dc.rights.license | CC BY 3.0 Unported | eng |
dc.rights.uri | https://creativecommons.org/licenses/by/3.0/ | eng |
dc.subject.ddc | 530 | eng |
dc.subject.gnd | Konferenzschrift | ger |
dc.subject.other | Spectrometry | eng |
dc.subject.other | Detection capability | eng |
dc.subject.other | Intensity ratio | eng |
dc.subject.other | Measuring conditions | eng |
dc.subject.other | Peak intensity | eng |
dc.subject.other | Peak-to-background ratios | eng |
dc.subject.other | Second orders | eng |
dc.subject.other | Second-order reflections | eng |
dc.subject.other | Spectral region | eng |
dc.subject.other | X rays | eng |
dc.title | Measuring conditions for second order X-ray Bragg-spectrometry | eng |
dc.type | Article | eng |
dc.type | Text | eng |
tib.accessRights | openAccess | eng |
wgl.contributor | IPHT | eng |
wgl.subject | Physik | eng |
wgl.type | Zeitschriftenartikel | eng |
wgl.type | Konferenzbeitrag | eng |
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