Spectromicroscopic measurements of electronic structure variations in atomically thin WSe2

dc.bibliographicCitation.firstPage95027eng
dc.bibliographicCitation.lastPage75eng
dc.bibliographicCitation.volume10eng
dc.contributor.authorKlaproth, T.
dc.contributor.authorHabenicht, C.
dc.contributor.authorSchuster, R.
dc.contributor.authorBüchner, B.
dc.contributor.authorKnupfer, M.
dc.contributor.authorKoitzsch, A.
dc.date.accessioned2020-11-08T17:50:15Z
dc.date.available2020-11-08T17:50:15Z
dc.date.issued2020
dc.description.abstractAtomically thin transition metal dichalcogenides (TMDCs) are promising candidates for implementation in next generation semiconducting devices, for which laterally homogeneous behavior is needed. Here, we study the electronic structure of atomically thin exfoliated WSe2, a prototypical TMDC with large spin–orbit coupling, by photoemission electron microscopy, electron energy-loss spectroscopy, and density functional theory. We resolve the inhomogeneities of the doping level by the varying energy positions of the valence band. There appear to be different types of inhomogeneities that respond differently to electron doping, introduced by potassium intercalation. In addition, we find that the doping process itself is more complex than previously anticipated and entails a distinct orbital and thickness dependence that needs to be considered for effective band engineering. In particular, the density of selenium vs tungsten states depends on the doping level, which leads to changes in the optical response beyond increased dielectric screening. Our work gives insight into the inhomogeneity of the electron structure of WSe2 and the effects of electron doping, provides microscopic understanding thereof, and improves the basis for property engineering of 2D materials.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://doi.org/10.34657/4502
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/5873
dc.language.isoengeng
dc.relation.doihttps://doi.org/10.1063/5.0018639
dc.relation.ispartofseriesAIP Advances 10 (2020)eng
dc.rights.licenseCC BY 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/eng
dc.subjectthin transition metal dichalcogenideeng
dc.subjectTMDCeng
dc.subjectsemiconducting deviceseng
dc.subject.ddc530eng
dc.titleSpectromicroscopic measurements of electronic structure variations in atomically thin WSe2ger
dc.typearticleeng
dc.typeTexteng
dcterms.bibliographicCitation.journalTitleAIP Advanceseng
tib.accessRightsopenAccesseng
wgl.contributorIFWDeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
Files
Original bundle
Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
Klaproth2020.pdf
Size:
3.38 MB
Format:
Adobe Portable Document Format
Description:
Collections