The impact of ultraviolet laser excitation during Raman spectroscopy of hexagonal boron nitride thin films

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Date
2020
Volume
51
Issue
12
Journal
Journal of Raman spectroscopy : JRS
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Publisher
Chichester [u.a.] : Wiley
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Abstract

We utilized excitation in the ultraviolet (UV) spectral range for the study of hexagonal boron nitride (h-BN) thin films on different substrates by Raman spectroscopy. Whereas UV excitation offers fundamental advantages for the investigation of h-BN and heterostructures with graphene, the actual Raman spectra recorded under ambient conditions reveal a temporal decay of the signal intensity. The disappearance of the Raman signal is found to be induced by thermally activated chemical reactions with ambient molecules at the h-BN surface. The chemical reactions could be strongly suppressed under vacuum conditions which, however, favor the formation of a carbonaceous surface contamination layer. For the improvement of the signal-to-noise ratio under ambient conditions, we propose a line-scan method for the acquisition of UV Raman spectra in atomically thin h-BN, a material which is expected to play a key role in future technologies based on 2D van der Waals heterostructures. © 2020 The Authors. Journal of Raman Spectroscopy published by John Wiley & Sons Ltd

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Karim, M., Lopes, J. M. J., & Ramsteiner, M. (2020). The impact of ultraviolet laser excitation during Raman spectroscopy of hexagonal boron nitride thin films (Chichester [u.a.] : Wiley). Chichester [u.a.] : Wiley. https://doi.org//10.1002/jrs.6007
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CC BY 4.0 Unported