The influence of the in-plane lattice constant on the superconducting transition temperature of FeSe0.7Te0.3 thin films
dc.bibliographicCitation.journalTitle | AIP Advances | eng |
dc.bibliographicCitation.volume | 7 | |
dc.contributor.author | Yuan, Feifei | |
dc.contributor.author | Iida, Kazumasa | |
dc.contributor.author | Grinenko, Vadim | |
dc.contributor.author | Chekhonin, Paul | |
dc.contributor.author | Pukenas, Aurimas | |
dc.contributor.author | Skrotzki, Werner | |
dc.contributor.author | Sakoda, Masahito | |
dc.contributor.author | Naito, Michio | |
dc.contributor.author | Sala, Alberto | |
dc.contributor.author | Putti, Marina | |
dc.contributor.author | Yamashita, Aichi | |
dc.contributor.author | Takano, Yoshihiko | |
dc.contributor.author | Shi, Zhixiang | |
dc.contributor.author | Nielsch, Kornelius | |
dc.contributor.author | Hühne, Ruben | |
dc.date.accessioned | 2017-07-22T02:54:03Z | |
dc.date.available | 2019-06-28T07:29:51Z | |
dc.date.issued | 2017 | |
dc.description.abstract | Epitaxial Fe(Se,Te) thin films were prepared by pulsed laser deposition on (La0.18Sr0.82)(Al0.59Ta0.41)O3 (LSAT), CaF2-buffered LSAT and bare CaF2 substrates, which exhibit an almost identical in-plane lattice parameter. The composition of all Fe(Se,Te) films were determined to be FeSe0.7Te0.3 by energy dispersive X-ray spectroscopy, irrespective of the substrate. Albeit the lattice parameters of all templates have comparable values, the in-plane lattice parameter of the FeSe0.7Te0.3 films varies significantly. We found that the superconducting transition temperature (Tc) of FeSe0.7Te0.3 thin films is strongly correlated with their a-axis lattice parameter. The highest Tc of over 19 K was observed for the film on bare CaF2 substrate, which is related to unexpectedly large in-plane compressive strain originating mostly from the thermal expansion mismatch between the FeSe0.7Te0.3 film and the substrate. | eng |
dc.description.version | publishedVersion | eng |
dc.format | application/pdf | |
dc.identifier.uri | https://doi.org/10.34657/4799 | |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/1225 | |
dc.language.iso | eng | eng |
dc.publisher | New York : American Institute of Physics | eng |
dc.relation.doi | https://doi.org/10.1063/1.4989566 | |
dc.rights.license | CC BY 4.0 Unported | eng |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | eng |
dc.subject.ddc | 620 | eng |
dc.subject.other | Lattice constants | eng |
dc.subject.other | Superconducting thin films | eng |
dc.subject.other | Buffer layers | eng |
dc.subject.other | Superconducting transitions | eng |
dc.subject.other | Transmission electron microscopy | eng |
dc.title | The influence of the in-plane lattice constant on the superconducting transition temperature of FeSe0.7Te0.3 thin films | eng |
dc.type | Article | eng |
dc.type | Text | eng |
tib.accessRights | openAccess | eng |
wgl.contributor | IFWD | eng |
wgl.subject | Ingenieurwissenschaften | eng |
wgl.type | Zeitschriftenartikel | eng |
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