Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy

Abstract

Magnetic force microscopy (MFM) can be considered as a standard tool for nano-scale investigation of magnetic domain structures by probing the local stray magnetic field landscape of the measured sample. However, this generally provides only qualitative data. To quantify the stray magnetic fields, the MFM system must be calibrated. To that end, a transfer function (TF) approach was proposed, that, unlike point probe models, fully considers the finite extent of the MFM tip. However, albeit being comprehensive, the TF approach is not yet well established, mainly due to the ambiguities concerning the input parameters and the measurement procedure. Additionally, the calibration process represents an ill-posed problem which requires a regularization that introduces further parameters. In this paper we propose a guideline for quantitative stray field measurements by standard MFM tools in ambient conditions. All steps of the measurement and calibration procedure are detailed, including reference sample and sample under test (SUT) measurements and the data analysis. The suitability of the reference sample used in the present work for calibrated measurements on a sub-micron scale is discussed. A specific regularization approach based on a Pseudo-Wiener Filter is applied and combined with criteria for the numerical determination of a unique regularization parameter. To demonstrate the robustness of such a defined approach, a round robin comparison of magnetic field measurements was conducted by four laboratories. The guideline, the reference sample and the results of the round robin are discussed.