Picosecond strain dynamics in Ge2Sb2Te5 monitored by time-resolved x-ray diffraction

dc.bibliographicCitation.journalTitlePhyical Review Beng
dc.contributor.authorFons, Paul
dc.contributor.authorRodenbach, Peter
dc.contributor.authorMitrofanov, Kirill V.
dc.contributor.authorKolobov, Alexander V.
dc.contributor.authorTominaga, Junji
dc.contributor.authorShayduk, Roman
dc.contributor.authorGiussani, Alessandro
dc.contributor.authorCalarco, Raffaella
dc.contributor.authorHanke, Michael
dc.contributor.authorRiechert, Henning
dc.contributor.authorSimpson, Robert E.
dc.contributor.authorHase, Muneaki
dc.date.accessioned2019-03-21T03:00:40Z
dc.date.available2019-06-28T12:39:00Z
dc.date.issued2014
dc.description.abstractCoherent phonons (CP) generated by laser pulses on the femtosecond scale have been proposed as a means to achieve ultrafast, non-thermal switching in phase-change materials such as Ge2Sb2Te5(GST). Here we use ultrafast optical pump pulses to induce coherent acoustic phonons and stroboscopically measure the corresponding lattice distortions in GST using 100 ps x-ray pulses from the ESRF storage ring. A linear-chain model provides a good description of the observed changes in the diffraction signal, however, the magnitudes of the measured shifts are too large to be explained by thermal effects alone implying the presence of transient non-equilibrium electron heating in addition to temperature driven expansion. The information on the movement of atoms during the excitation process can lead to greater insight into the possibilities of using CP-induced phase-transitions in GST.
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/4156
dc.language.isoengeng
dc.publisherCambridge : arXiv
dc.relation.urihttps://arxiv.org/abs/1409.6888
dc.rights.licenseDieses Dokument darf im Rahmen von § 53 UrhG zum eigenen Gebrauch kostenfrei heruntergeladen, gelesen, gespeichert und ausgedruckt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden.ger
dc.rights.licenseThis document may be downloaded, read, stored and printed for your own use within the limits of § 53 UrhG but it may not be distributed via the internet or passed on to external parties.eng
dc.subject.ddc530
dc.subject.otherMaterials Scienceeng
dc.titlePicosecond strain dynamics in Ge2Sb2Te5 monitored by time-resolved x-ray diffraction
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorPDIeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
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