Sample chamber for synchrotron based in-situ X-ray diffraction experiments under electric fields and temperatures between 100 K and 1250 K

dc.bibliographicCitation.firstPage158eng
dc.bibliographicCitation.issue1eng
dc.bibliographicCitation.journalTitleJournal of synchrotron radiationeng
dc.bibliographicCitation.lastPage168eng
dc.bibliographicCitation.volume28eng
dc.contributor.authorNentwich, Melanie
dc.contributor.authorWeigel, Tina
dc.contributor.authorRichter, Carsten
dc.contributor.authorStöcker, Hartmut
dc.contributor.authorMehner, Erik
dc.contributor.authorJachalke, Sven
dc.contributor.authorNovikov, Dmitri V.
dc.contributor.authorZschornak, Matthias
dc.contributor.authorMeyer, Dirk C.
dc.date.accessioned2022-03-24T12:54:06Z
dc.date.available2022-03-24T12:54:06Z
dc.date.issued2021
dc.description.abstractMany scientific questions require X-ray experiments conducted at varying temperatures, sometimes combined with the application of electric fields. Here, a customized sample chamber developed for beamlines P23 and P24 of PETRA III at DESY to suit these demands is presented. The chamber body consists mainly of standard vacuum parts housing the heater/cooler assembly supplying a temperature range of 100 K to 1250 K and an xyz manipulator holding an electric contact needle for electric measurements at both high voltage and low current. The chamber is closed by an exchangeable hemispherical dome offering all degrees of freedom for single-crystal experiments within one hemisphere of solid angle. The currently available dome materials (PC, PS, PEEK polymers) differ in their absorption and scattering characteristics, with PEEK providing the best overall performance. The article further describes heating and cooling capabilities, electric characteristics, and plans for future upgrades of the chamber. Examples of applications are discussed.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/8359
dc.identifier.urihttps://doi.org/10.34657/7397
dc.language.isoengeng
dc.publisherChester : IUCreng
dc.relation.doihttps://doi.org/10.1107/S1600577520014344
dc.relation.essn1600-5775
dc.rights.licenseCC BY 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/eng
dc.subject.ddc540eng
dc.subject.ddc550eng
dc.subject.otherX-ray diffractioneng
dc.subject.otherelectric fieldeng
dc.subject.otherinstrumentationeng
dc.subject.othersample environmenteng
dc.titleSample chamber for synchrotron based in-situ X-ray diffraction experiments under electric fields and temperatures between 100 K and 1250 Keng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorIKZeng
wgl.subjectChemieeng
wgl.typeZeitschriftenartikeleng
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