A shape calculus analysis for tracking type formulations for tracking type formulations in electrical impedance tomography

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Date
2006
Volume
1116
Issue
Journal
Series Titel
WIAS Preprints
Book Title
Publisher
Berlin : Weierstraß-Institut für Angewandte Analysis und Stochastik
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Abstract

In the paper [17], the authors investigated the identification of an obstacle or void of perfectly conducting material in a two-dimensional domain by measurements of voltage and currents at the boundary. In particular, the reformulation of the given nonlinear identification problem was considered as a shape optimization problem using the Kohn and Vogelius criterion. The compactness of the complete shape Hessian at the optimal inclusion was proven, verifying strictly the ill-posedness of the identification problem. The aim of the paper is to present a similar analysis for the related least square tracking formulations. It turns out that the two-norm-discrepancy is of the same principal nature as for the Kohn and Vogelius objective. As a byproduct, the necessary first order optimality condition are shown to be satisfied if and only if the data are perfectly matching. Finally, we comment on possible consequences of the two-norm-discrepancy for the regularization issue.

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Citation
Eppler, K. (2006). A shape calculus analysis for tracking type formulations for tracking type formulations in electrical impedance tomography. Berlin : Weierstraß-Institut für Angewandte Analysis und Stochastik.
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