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In/GaN(0001)- ( √{ 3 } × √{ 3 } ) R 30 ° adsorbate structure as a template for embedded (In, Ga)N/GaN monolayers and short-period superlattices
dc.bibliographicCitation.journalTitle | Applied Physics Letters | eng |
dc.contributor.author | Chèze, C. | |
dc.contributor.author | Feix, F. | |
dc.contributor.author | Anikeeva, M. | |
dc.contributor.author | Schulz, T. | |
dc.contributor.author | Albrecht, M. | |
dc.contributor.author | Riechert, H. | |
dc.contributor.author | Brandt, O. | |
dc.contributor.author | Calarco, R. | |
dc.date.accessioned | 2018-01-25T03:03:00Z | |
dc.date.available | 2019-06-28T12:39:22Z | |
dc.date.issued | 2017 | |
dc.description.abstract | We explore an alternative way to fabricate (In, Ga)N/GaN short-period superlattices on GaN(0001) by plasma-assisted molecular beam epitaxy. We exploit the existence of an In adsorbate structure manifesting itself by a ( √{ 3 } × √{ 3 } ) R 30 ° surface reconstruction observed in-situ by reflection high-energy electron diffraction. This In adlayer accommodates a maximum of 1/3 monolayer of In on the GaN surface and, under suitable conditions, can be embedded into GaN to form an In0.33Ga0.67N quantum sheet whose width is naturally limited to a single monolayer. Periodically inserting these quantum sheets, we synthesize (In,Ga)N/GaN short-period superlattices with abrupt interfaces and high periodicity as demonstrated by x-ray diffractometry and scanning transmission electron microscopy. The embedded quantum sheets are found to consist of single monolayers with an In content of 0.25-0.29. For a barrier thickness of 6 monolayers, the superlattice gives rise to a photoluminescence band at 3.16 eV, close to the theoretically predicted values for these structures. | eng |
dc.description.version | publishedVersion | eng |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/4252 | |
dc.language.iso | eng | eng |
dc.publisher | Cambridge : arXiv | eng |
dc.relation.uri | https://arxiv.org/abs/1701.04680 | |
dc.rights.license | This document may be downloaded, read, stored and printed for your own use within the limits of § 53 UrhG but it may not be distributed via the internet or passed on to external parties. | eng |
dc.rights.license | Dieses Dokument darf im Rahmen von § 53 UrhG zum eigenen Gebrauch kostenfrei heruntergeladen, gelesen, gespeichert und ausgedruckt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. | ger |
dc.subject.ddc | 530 | eng |
dc.subject.other | Adsorbate structures | eng |
dc.subject.other | III-V semiconductors | eng |
dc.subject.other | X-ray diffraction | eng |
dc.subject.other | Reflection high energy electron diffraction | eng |
dc.subject.other | Surface reconstruction | eng |
dc.subject.other | Condensed Matter - Materials Science | eng |
dc.title | In/GaN(0001)- ( √{ 3 } × √{ 3 } ) R 30 ° adsorbate structure as a template for embedded (In, Ga)N/GaN monolayers and short-period superlattices | eng |
dc.type | Article | eng |
dc.type | Text | eng |
tib.accessRights | openAccess | eng |
wgl.contributor | PDI | eng |
wgl.contributor | IKZ | eng |
wgl.subject | Physik | eng |
wgl.type | Zeitschriftenartikel | eng |