In/GaN(0001)- ( √{ 3 } × √{ 3 } ) R 30 ° adsorbate structure as a template for embedded (In, Ga)N/GaN monolayers and short-period superlattices

dc.bibliographicCitation.journalTitleApplied Physics Letterseng
dc.contributor.authorChèze, C.
dc.contributor.authorFeix, F.
dc.contributor.authorAnikeeva, M.
dc.contributor.authorSchulz, T.
dc.contributor.authorAlbrecht, M.
dc.contributor.authorRiechert, H.
dc.contributor.authorBrandt, O.
dc.contributor.authorCalarco, R.
dc.date.accessioned2018-01-25T03:03:00Z
dc.date.available2019-06-28T12:39:22Z
dc.date.issued2017
dc.description.abstractWe explore an alternative way to fabricate (In, Ga)N/GaN short-period superlattices on GaN(0001) by plasma-assisted molecular beam epitaxy. We exploit the existence of an In adsorbate structure manifesting itself by a ( √{ 3 } × √{ 3 } ) R 30 ° surface reconstruction observed in-situ by reflection high-energy electron diffraction. This In adlayer accommodates a maximum of 1/3 monolayer of In on the GaN surface and, under suitable conditions, can be embedded into GaN to form an In0.33Ga0.67N quantum sheet whose width is naturally limited to a single monolayer. Periodically inserting these quantum sheets, we synthesize (In,Ga)N/GaN short-period superlattices with abrupt interfaces and high periodicity as demonstrated by x-ray diffractometry and scanning transmission electron microscopy. The embedded quantum sheets are found to consist of single monolayers with an In content of 0.25-0.29. For a barrier thickness of 6 monolayers, the superlattice gives rise to a photoluminescence band at 3.16 eV, close to the theoretically predicted values for these structures.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/4252
dc.language.isoengeng
dc.publisherCambridge : arXiveng
dc.relation.urihttps://arxiv.org/abs/1701.04680
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dc.subject.ddc530eng
dc.subject.otherAdsorbate structureseng
dc.subject.otherIII-V semiconductorseng
dc.subject.otherX-ray diffractioneng
dc.subject.otherReflection high energy electron diffractioneng
dc.subject.otherSurface reconstructioneng
dc.subject.otherCondensed Matter - Materials Scienceeng
dc.titleIn/GaN(0001)- ( √{ 3 } × √{ 3 } ) R 30 ° adsorbate structure as a template for embedded (In, Ga)N/GaN monolayers and short-period superlatticeseng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorPDIeng
wgl.contributorIKZeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
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