Investigation of changes in crystalline and amorphous structure during deformation of nano-reinforced semi-crystalline polymers by space-resolved synchrotron saxs and waxs

dc.bibliographicCitation.firstPage159eng
dc.bibliographicCitation.issue1eng
dc.bibliographicCitation.journalTitleProcedia Engineeringeng
dc.bibliographicCitation.volume1eng
dc.contributor.authorSchneider, K.
dc.contributor.authorSchone, A.
dc.contributor.authorJun, T.-S.
dc.contributor.authorKorsunsky, A.M.
dc.date.accessioned2020-08-13T10:35:50Z
dc.date.available2020-08-13T10:35:50Z
dc.date.issued2009
dc.description.abstractComplex structural changes occur in semi-crystalline polymers during deformation. In (nano-)filled systems the situation becomes even more complicated, since not only phase changes may take place, but also local (interfacial) failure between phases may occur. To help identify specific processes taking place within these systems, simultaneous small- and wide-angle X-ray scattering (SAXS/WAXS) measurements were performed using synchrotron radiation during in situ deformation. Using a highly focused beam, spatially resolved local information can be extracted by scanning the beam across the deformed/damaged region within the sample. The characteristic changes in the different phases are presented and discussed. While the study of WAXS patterns gives insight into the orientation and dimensions of the crystallites, SAXS provides information about the mutual arrangement of phases and the interfacial failure phenomena. Based on the analysis of the results obtained in our experiments it will be shown that the first changes in the crystalline phase appear long before macroscopic yielding of the sample is reached, i.e. the onset of irreversible deformation takes place. In the post-yield regime radical changes are observed in both the long- and short-range structures. It is concluded that the presence of nano-fillers exerts a strong influence on the establishment of microcrystalline structure, and hence also on the deformation behaviour at the microscopic scale.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://doi.org/10.34657/4176
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/5547
dc.language.isoengeng
dc.publisherAmsterdam : Elseviereng
dc.relation.doihttps://doi.org/10.1016/j.proeng.2009.06.037
dc.relation.issn1877-7058
dc.rights.licenseCC BY-NC-ND 3.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/3.0/eng
dc.subject.ddc620eng
dc.subject.otherDeformationeng
dc.subject.otherPA-6eng
dc.subject.otherStructure characterisationeng
dc.subject.otherSynchrotron SAXSeng
dc.subject.otherWAXSeng
dc.subject.otherZn0eng
dc.subject.otherCrystalline materialseng
dc.subject.otherPolymerseng
dc.subject.otherSynchrotron radiationeng
dc.subject.otherSynchrotronseng
dc.subject.otherX ray scatteringeng
dc.subject.otherDeformation behavioureng
dc.subject.otherIrreversible deformationeng
dc.subject.otherMicrocrystalline structureseng
dc.subject.otherSemi-crystalline polymereng
dc.subject.otherShort-range structureeng
dc.subject.otherSmall and wide angle x ray scatteringseng
dc.subject.otherSynchrotron saxseng
dc.subject.otherWAXSeng
dc.subject.otherDeformationeng
dc.titleInvestigation of changes in crystalline and amorphous structure during deformation of nano-reinforced semi-crystalline polymers by space-resolved synchrotron saxs and waxseng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorIPFeng
wgl.subjectIngenieurwissenschafteneng
wgl.typeZeitschriftenartikeleng
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