Kelvin probe force microscopy of charged indentation-induced dislocation structures in KBr
dc.bibliographicCitation.firstPage | 33 | |
dc.bibliographicCitation.lastPage | 37 | |
dc.bibliographicCitation.volume | 2008 | |
dc.contributor.author | Egberts, Philip | |
dc.contributor.author | Bennewitz, Roland | |
dc.date.accessioned | 2016-03-24T17:39:04Z | |
dc.date.available | 2019-06-28T12:38:24Z | |
dc.date.issued | 2009 | |
dc.description.abstract | The incipient stages of plasticity in KBr single crystals have been examined in ultrahigh vacuum by means of Atomic Force Microscopy and Kelvin Probe Force Microscopy (KPFM). Conducting diamond-coated tips have been used to both indent the crystals and image the resulting plastic deformation. KPFM reveals that edge dislocations intersecting the surface carry a negative charge similar to kinks in surface steps, while screw dislocations show no contrast. Weak topographic features extending in <110> direction from the indentation are identified by atomic-resolution imaging to be pairs of edge dislocations of opposite sign, separated by a distance similar to the indenter radius. They indicate the glide of two parallel {110} planes perpendicular to the surface, a process that allows for a slice of KBr to be pushed away from the indentation site. | eng |
dc.description.version | publishedVersion | eng |
dc.format | application/pdf | |
dc.identifier.uri | https://doi.org/10.34657/1557 | |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/4019 | |
dc.language.iso | eng | eng |
dc.publisher | Saarbrücken : Leibniz-Institut für neue Materialien | eng |
dc.relation.ispartofseries | Jahresbericht ... / Leibniz-Institut für Neue Materialien, Volume 2008, Page 33-37 | eng |
dc.rights.license | This document may be downloaded, read, stored and printed for your own use within the limits of § 53 UrhG but it may not be distributed via the internet or passed on to external parties. | eng |
dc.rights.license | Dieses Dokument darf im Rahmen von § 53 UrhG zum eigenen Gebrauch kostenfrei heruntergeladen, gelesen, gespeichert und ausgedruckt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. | ger |
dc.subject.ddc | 530 | eng |
dc.title | Kelvin probe force microscopy of charged indentation-induced dislocation structures in KBr | eng |
dc.type | article | eng |
dc.type | Text | eng |
dcterms.bibliographicCitation.journalTitle | Jahresbericht ... / Leibniz-Institut für Neue Materialien | eng |
tib.accessRights | openAccess | eng |
wgl.contributor | INM | eng |
wgl.subject | Physik | eng |
wgl.type | Zeitschriftenartikel | eng |
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