Kelvin probe force microscopy of charged indentation-induced dislocation structures in KBr

dc.bibliographicCitation.firstPage33
dc.bibliographicCitation.lastPage37
dc.bibliographicCitation.volume2008
dc.contributor.authorEgberts, Philip
dc.contributor.authorBennewitz, Roland
dc.date.accessioned2016-03-24T17:39:04Z
dc.date.available2019-06-28T12:38:24Z
dc.date.issued2009
dc.description.abstractThe incipient stages of plasticity in KBr single crystals have been examined in ultrahigh vacuum by means of Atomic Force Microscopy and Kelvin Probe Force Microscopy (KPFM). Conducting diamond-coated tips have been used to both indent the crystals and image the resulting plastic deformation. KPFM reveals that edge dislocations intersecting the surface carry a negative charge similar to kinks in surface steps, while screw dislocations show no contrast. Weak topographic features extending in <110> direction from the indentation are identified by atomic-resolution imaging to be pairs of edge dislocations of opposite sign, separated by a distance similar to the indenter radius. They indicate the glide of two parallel {110} planes perpendicular to the surface, a process that allows for a slice of KBr to be pushed away from the indentation site.eng
dc.description.versionpublishedVersioneng
dc.formatapplication/pdf
dc.identifier.urihttps://doi.org/10.34657/1557
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/4019
dc.language.isoengeng
dc.publisherSaarbrücken : Leibniz-Institut für neue Materialieneng
dc.relation.ispartofseriesJahresbericht ... / Leibniz-Institut für Neue Materialien, Volume 2008, Page 33-37eng
dc.rights.licenseThis document may be downloaded, read, stored and printed for your own use within the limits of § 53 UrhG but it may not be distributed via the internet or passed on to external parties.eng
dc.rights.licenseDieses Dokument darf im Rahmen von § 53 UrhG zum eigenen Gebrauch kostenfrei heruntergeladen, gelesen, gespeichert und ausgedruckt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden.ger
dc.subject.ddc530eng
dc.titleKelvin probe force microscopy of charged indentation-induced dislocation structures in KBreng
dc.typearticleeng
dc.typeTexteng
dcterms.bibliographicCitation.journalTitleJahresbericht ... / Leibniz-Institut für Neue Materialieneng
tib.accessRightsopenAccesseng
wgl.contributorINMeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
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