Target ion and neutral spread in high power impulse magnetron sputtering

dc.bibliographicCitation.date2023
dc.bibliographicCitation.firstPage013002
dc.bibliographicCitation.issue1
dc.bibliographicCitation.journalTitleJournal of vacuum science & technology : JVST : A, Vacuum, surfaces, and filmseng
dc.bibliographicCitation.volume41
dc.contributor.authorHajihoseini, H.
dc.contributor.authorBrenning, N.
dc.contributor.authorRudolph, M.
dc.contributor.authorRaadu, M.A.
dc.contributor.authorLundin, D.
dc.contributor.authorFischer, J.
dc.contributor.authorMinea, T. M.
dc.contributor.authorGudmundsson, J.T.
dc.date.accessioned2023-02-21T06:32:55Z
dc.date.available2023-02-21T06:32:55Z
dc.date.issued2022
dc.description.abstractIn magnetron sputtering, only a fraction of the sputtered target material leaving the ionization region is directed toward the substrate. This fraction may be different for ions and neutrals of the target material as the neutrals and ions can exhibit a different spread as they travel from the target surface toward the substrate. This difference can be significant in high power impulse magnetron sputtering (HiPIMS) where a substantial fraction of the sputtered material is known to be ionized. Geometrical factors or transport parameters that account for the loss of produced film-forming species to the chamber walls are needed for experimental characterization and modeling of the magnetron sputtering discharge. Here, we experimentally determine transport parameters for ions and neutral atoms in a HiPIMS discharge with a titanium target for various magnet configurations. Transport parameters are determined to a typical substrate, with the same diameter (100 mm) as the cathode target, and located at a distance 70 mm from the target surface. As the magnet configuration and/or the discharge current are changed, the transport parameter for neutral atoms ζ tn remains roughly the same, while transport parameters for ions ζ ti vary greatly. Furthermore, the relative ion-to-neutral transport factors, ζ ti / ζ tn, that describe the relative deposited fractions of target material ions and neutrals onto the substrate, are determined to be in the range from 0.4 to 1.1.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/11469
dc.identifier.urihttp://dx.doi.org/10.34657/10503
dc.language.isoeng
dc.publisherNew York, NY : Inst.
dc.relation.doihttps://doi.org/10.1116/6.0002292
dc.relation.essn1520-8559
dc.relation.issn0734-2101
dc.rights.licenseCC BY 4.0 Unported
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.subject.ddc530
dc.subject.otherGeometrical factorseng
dc.subject.otherHigh powereng
dc.subject.otherMagnet configurationseng
dc.subject.otherMagnetron-sputteringeng
dc.subject.otherNeutral atomseng
dc.subject.otherSputtered materialseng
dc.subject.otherTarget ionseng
dc.subject.otherTarget materialseng
dc.subject.otherTarget surfaceeng
dc.subject.otherTransport parameterseng
dc.titleTarget ion and neutral spread in high power impulse magnetron sputteringeng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccess
wgl.contributorIOM
wgl.subjectPhysikger
wgl.typeZeitschriftenartikelger
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