Leached antireflection surfaces Part 2. Characterization of surfaces produced by the neutral solution process

dc.bibliographicCitation.firstPage302
dc.bibliographicCitation.journalTitleGlastechnische Berichte
dc.bibliographicCitation.lastPage311
dc.bibliographicCitation.volume60
dc.contributor.authorCook, Lee M.
dc.contributor.authorMarker III, A. J.
dc.contributor.authorMader, Karl-Heinz
dc.contributor.authorBach, Hans
dc.contributor.authorMüller, Hartmut
dc.date.accessioned2024-08-29T07:54:27Z
dc.date.available2024-08-29T07:54:27Z
dc.date.issued1987
dc.description.abstractCharacterization of leached antireflective surfaces on BK-7 optical borosilicate glass was undertaken using IR spectroscopy, IBSCA, scanning electron microscopy, transmission electron microscopy, electron microprobe, electron diffraction and analysis of reflectance spectra to provide more information on the leaching process. Leached surfaces were found to have double-layer characteristics. The outer layer consisted primarily of SiO2 and AI2O3, present as both χ-Al2O3 and amorphous species, while the inner layer was almost entirely SiO2. At very long leaching times two discrete films were observed.ger
dc.description.versionpublishedVersion
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/15282
dc.identifier.urihttps://doi.org/10.34657/14304
dc.language.isoeng
dc.publisherOffenbach : Verlag der Deutschen Glastechnischen Gesellschaft
dc.relation.issn0017-1085
dc.rights.licenseCC BY 3.0 DE
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/de/
dc.subject.ddc660
dc.titleLeached antireflection surfaces Part 2. Characterization of surfaces produced by the neutral solution processger
dc.typeArticle
dc.typeText
tib.accessRightsopenAccess
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