Leached antireflection surfaces Part 2. Characterization of surfaces produced by the neutral solution process
dc.bibliographicCitation.firstPage | 302 | |
dc.bibliographicCitation.journalTitle | Glastechnische Berichte | |
dc.bibliographicCitation.lastPage | 311 | |
dc.bibliographicCitation.volume | 60 | |
dc.contributor.author | Cook, Lee M. | |
dc.contributor.author | Marker III, A. J. | |
dc.contributor.author | Mader, Karl-Heinz | |
dc.contributor.author | Bach, Hans | |
dc.contributor.author | Müller, Hartmut | |
dc.date.accessioned | 2024-08-29T07:54:27Z | |
dc.date.available | 2024-08-29T07:54:27Z | |
dc.date.issued | 1987 | |
dc.description.abstract | Characterization of leached antireflective surfaces on BK-7 optical borosilicate glass was undertaken using IR spectroscopy, IBSCA, scanning electron microscopy, transmission electron microscopy, electron microprobe, electron diffraction and analysis of reflectance spectra to provide more information on the leaching process. Leached surfaces were found to have double-layer characteristics. The outer layer consisted primarily of SiO2 and AI2O3, present as both χ-Al2O3 and amorphous species, while the inner layer was almost entirely SiO2. At very long leaching times two discrete films were observed. | ger |
dc.description.version | publishedVersion | |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/15282 | |
dc.identifier.uri | https://doi.org/10.34657/14304 | |
dc.language.iso | eng | |
dc.publisher | Offenbach : Verlag der Deutschen Glastechnischen Gesellschaft | |
dc.relation.issn | 0017-1085 | |
dc.rights.license | CC BY 3.0 DE | |
dc.rights.uri | https://creativecommons.org/licenses/by/3.0/de/ | |
dc.subject.ddc | 660 | |
dc.title | Leached antireflection surfaces Part 2. Characterization of surfaces produced by the neutral solution process | ger |
dc.type | Article | |
dc.type | Text | |
tib.accessRights | openAccess |
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