Simultaneous Effect of Ultraviolet Radiation and Surface Modification on the Work Function and Hole Injection Properties of ZnO Thin Films

dc.bibliographicCitation.firstPage1900876eng
dc.bibliographicCitation.issue5eng
dc.bibliographicCitation.volume217eng
dc.contributor.authorRaoufi, Meysam
dc.contributor.authorHörmann, Ulrich
dc.contributor.authorLigorio, Giovanni
dc.contributor.authorHildebrandt, Jana
dc.contributor.authorPätzel, Michael
dc.contributor.authorSchultz, Thorsten
dc.contributor.authorPerdigon, Lorena
dc.contributor.authorKoch, Norbert
dc.contributor.authorList-Kratochvil, Emil
dc.contributor.authorHecht, Stefan
dc.contributor.authorNeher, Dieter
dc.date.accessioned2021-08-03T09:11:47Z
dc.date.available2021-08-03T09:11:47Z
dc.date.issued2020
dc.description.abstractThe combined effect of ultraviolet (UV) light soaking and self-assembled monolayer deposition on the work function (WF) of thin ZnO layers and on the efficiency of hole injection into the prototypical conjugated polymer poly(3-hexylthiophen-2,5-diyl) (P3HT) is systematically investigated. It is shown that the WF and injection efficiency depend strongly on the history of UV light exposure. Proper treatment of the ZnO layer enables ohmic hole injection into P3HT, demonstrating ZnO as a potential anode material for organic optoelectronic devices. The results also suggest that valid conclusions on the energy-level alignment at the ZnO/organic interfaces may only be drawn if the illumination history is precisely known and controlled. This is inherently problematic when comparing electronic data from ultraviolet photoelectron spectroscopy (UPS) measurements carried out under different or ill-defined illumination conditions. © 2020 The Authors. Published by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheimeng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/6472
dc.identifier.urihttps://doi.org/10.34657/5519
dc.language.isoengeng
dc.publisherWeinheim : Wiley-VCHeng
dc.relation.doihttps://doi.org/10.1002/pssa.201900876
dc.relation.essn1521-396X
dc.relation.essn1862-6319
dc.relation.ispartofseriesPhysica Status Solidi (A) Applications and Materials Science 217 (2020), Nr. 5eng
dc.relation.issn0031-8965
dc.relation.issn1862-6300
dc.rights.licenseCC BY 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/eng
dc.subjectcharge injection across hybrid interfaceseng
dc.subjectenergy-level alignmentseng
dc.subjecthybrid metal oxides/organic interfacesger
dc.subject.ddc530eng
dc.titleSimultaneous Effect of Ultraviolet Radiation and Surface Modification on the Work Function and Hole Injection Properties of ZnO Thin Filmseng
dc.typearticleeng
dc.typeTexteng
dcterms.bibliographicCitation.journalTitlePhysica Status Solidi (A) Applications and Materials Scienceeng
tib.accessRightsopenAccesseng
wgl.contributorDWIeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
Files
Original bundle
Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
pssa.201900876.pdf
Size:
374.69 KB
Format:
Adobe Portable Document Format
Description:
Collections