Data processing techniques for ion and electron-energy distribution functions

dc.bibliographicCitation.articleNumber040501
dc.bibliographicCitation.firstPage040501
dc.bibliographicCitation.issue4
dc.bibliographicCitation.journalTitlePhysics of Plasmas
dc.bibliographicCitation.volume30
dc.contributor.authorCaldarelli, A.
dc.contributor.authorFilleul, F.
dc.contributor.authorBoswell, R. W.
dc.contributor.authorCharles, C.
dc.contributor.authorRattenbury, N. J.
dc.contributor.authorCater, J. E.
dc.date.accessioned2025-01-28T08:06:56Z
dc.date.available2025-01-28T08:06:56Z
dc.date.issued2023
dc.description.abstractRetarding field energy analyzers and Langmuir probes are routinely used to obtain ion and electron-energy distribution functions (IEDF and EEDF). These typically require knowledge of the first and second derivatives of the current-voltage characteristics, both of which can be obtained using analog and numerical techniques. A frequent problem with electric-probe plasma diagnostics is the noise from the plasma environment and measurement circuits. This poses challenges inherent to differentiating noisy signals, which often require prior filtering of the raw current-voltage data before evaluating the distribution functions. A review of commonly used filtering and differentiation techniques is presented. It covers analog differentiator circuits, polynomial fitting (Savitzky-Golay filter and B-spline fitting), window filtering (Gaussian and Blackman windows) methods as well as the AC superimposition and Gaussian deconvolution routines. The application of each method on experimental datasets with signal-to-noise ratios ranging from 44 to 66 dB is evaluated with regard to the dynamic range, energy resolution, and signal distortion of the obtained IEDF and EEDF as well as to the deduced plasma parameters.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/18523
dc.identifier.urihttps://doi.org/10.34657/17543
dc.language.isoeng
dc.publisherMelville, NY : AIP
dc.relation.doihttps://doi.org/10.1063/5.0133840
dc.relation.essn1089-7674
dc.relation.issn1070-664X
dc.rights.licenseCC BY 4.0 Unported
dc.rights.urihttps://creativecommons.org/licenses/by/4.0
dc.subject.ddc530
dc.subject.otherCurrent voltage characteristicseng
dc.subject.otherData handlingeng
dc.subject.otherDissociationeng
dc.subject.otherDistribution functionseng
dc.subject.otherElectron energy levelseng
dc.subject.otherPlasma diagnosticseng
dc.subject.otherProbeseng
dc.subject.otherCurrent-voltage characteristicseng
dc.subject.otherData processing techniqueseng
dc.subject.otherDerivatives of the currentseng
dc.subject.otherElectron energy distribution functionseng
dc.subject.otherEnergy analyzereng
dc.subject.otherField energyeng
dc.subject.otherFirst derivativeeng
dc.subject.otherIon energy distribution functionseng
dc.subject.otherNumerical techniqueseng
dc.subject.otherSecond derivativeseng
dc.subject.otherSignal to noise ratioeng
dc.titleData processing techniques for ion and electron-energy distribution functionseng
dc.typeArticle
dc.typeText
tib.accessRightsopenAccess
wgl.contributorINP
wgl.subjectPhysikger
wgl.typeZeitschriftenartikelger
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