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Potentials of synchrotron radiation induced X-ray standing waves and X-ray reflectivity measurements in material analysis
dc.contributor.author | Krämer, Markus | |
dc.date.accessioned | 2016-03-24T17:37:39Z | |
dc.date.available | 2019-06-28T12:39:09Z | |
dc.date.issued | 2007 | |
dc.description.abstract | [no abstract available] | |
dc.description.version | publishedVersion | eng |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/4200 | |
dc.language.iso | eng | eng |
dc.publisher | Dortmund : Technische Universität Dortmund | |
dc.relation.uri | http://hdl.handle.net/2003/23543 | |
dc.rights.license | Dieses Dokument darf im Rahmen von § 53 UrhG zum eigenen Gebrauch kostenfrei heruntergeladen, gelesen, gespeichert und ausgedruckt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. | ger |
dc.rights.license | This document may be downloaded, read, stored and printed for your own use within the limits of § 53 UrhG but it may not be distributed via the internet or passed on to external parties. | eng |
dc.subject.ddc | 530 | |
dc.subject.other | X-ray standing waves | eng |
dc.subject.other | XSW | eng |
dc.subject.other | X-ray reflectivity | eng |
dc.subject.other | XRR | eng |
dc.subject.other | X-ray fluorescence | eng |
dc.subject.other | XRF | eng |
dc.subject.other | layers | eng |
dc.subject.other | nm | eng |
dc.subject.other | Semiconductor | eng |
dc.subject.other | Biofilms | eng |
dc.subject.other | Synchrotron | eng |
dc.subject.other | Material analysis | eng |
dc.title | Potentials of synchrotron radiation induced X-ray standing waves and X-ray reflectivity measurements in material analysis | |
dc.type | DoctoralThesis | eng |
dc.type | Text | eng |
tib.accessRights | openAccess | eng |
wgl.contributor | ISAS | eng |
wgl.subject | Physik | eng |
wgl.type | Hochschulschrift | eng |