Operation mechanism of high performance organic permeable base transistors with an insulated and perforated base electrode

dc.bibliographicCitation.firstPage094501eng
dc.bibliographicCitation.issue9eng
dc.bibliographicCitation.journalTitleJournal of applied physics : AIP's archival journal for significant new results in applied physicseng
dc.bibliographicCitation.volume120eng
dc.contributor.authorKaschura, Felix
dc.contributor.authorFischer, Axel
dc.contributor.authorKlinger, Markus P.
dc.contributor.authorDoan, Duy Hai
dc.contributor.authorKoprucki, Thomas
dc.contributor.authorGlitzky, Annegret
dc.contributor.authorKasemann, Daniel
dc.contributor.authorWidmer, Johannes
dc.contributor.authorLeo, Karl
dc.date.accessioned2022-06-22T11:43:27Z
dc.date.available2022-06-22T11:43:27Z
dc.date.issued2016
dc.description.abstractThe organic permeable base transistor is a vertical transistor architecture that enables high performance while maintaining a simple low-resolution fabrication. It has been argued that the charge transport through the nano-sized openings of the central base electrode limits the performance. Here, we demonstrate by using 3D drift-diffusion simulations that this is not the case in the relevant operation range. At low current densities, the applied base potential controls the number of charges that can pass through an opening and the opening is the current limiting factor. However, at higher current densities, charges accumulate within the openings and in front of the base insulation, allowing for an efficient lateral transport of charges towards the next opening. The on-state in the current-voltage characteristics reaches the maximum possible current given by space charge limited current transport through the intrinsic semiconductor layers. Thus, even a small effective area of the openings can drive huge current densities, and further device optimization has to focus on reducing the intrinsic layer thickness to a minimum.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/9124
dc.identifier.urihttps://doi.org/10.34657/8162
dc.language.isoengeng
dc.publisherMelville, NY : American Inst. of Physicseng
dc.relation.doihttps://doi.org/10.1063/1.4962009
dc.relation.essn1089-7550
dc.rights.licenseCC BY 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/eng
dc.subject.ddc530eng
dc.subject.otherCurrent densityeng
dc.subject.otherCurrent voltage characteristicseng
dc.subject.otherElectrodeseng
dc.subject.otherDrift-diffusion simulationeng
dc.subject.otherIntrinsic layer thicknesseng
dc.subject.otherIntrinsic semiconductorseng
dc.subject.otherLow current densityeng
dc.subject.otherOperation mechanismeng
dc.subject.otherPermeable base transistorseng
dc.subject.otherSpace charge limited currentseng
dc.subject.otherVertical transistorseng
dc.subject.otherTransistorseng
dc.titleOperation mechanism of high performance organic permeable base transistors with an insulated and perforated base electrodeeng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorWIASeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
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