Characterization of the chemical kinetics in an O2/HMDSO RF plasma for material processing

dc.bibliographicCitation.firstPage1
dc.bibliographicCitation.journalTitleAdvances in Physical Chemistry
dc.bibliographicCitation.lastPage6
dc.bibliographicCitation.volume2012
dc.contributor.authorBarni, Ruggero
dc.contributor.authorZanini, Stefano
dc.contributor.authorRiccardi, Claudia
dc.date.accessioned2025-03-05T07:21:35Z
dc.date.available2025-03-05T07:21:35Z
dc.date.issued2012
dc.description.abstractExperimental study of the plasma gas phase in low-pressure radiofrequency discharges of oxygen and hexamethyldisiloxane is presented. The plasma phase has been studied by means of optical emission spectroscopy. Mass spectroscopy of the neutral and of the charged species has been performed too, directly sampling the plasma gas phase, by a dedicated spectrometer. We also measured the ion energy distribution. We have studied the influence of the operating conditions on the plasma gas-phase composition which plays a primary role in the formation process of SiO2 films, which are known for their important applicative uses.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/18767
dc.identifier.urihttps://doi.org/10.34657/17786
dc.language.isoeng
dc.publisherNew York, NY : Hindawi
dc.relation.doihttps://doi.org/10.1155/2012/205380
dc.relation.essn1687-7993
dc.relation.issn1687-7985
dc.rights.licenseCC BY 3.0 Unported
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/
dc.subject.ddc540
dc.subject.otherplasmaeng
dc.titleCharacterization of the chemical kinetics in an O2/HMDSO RF plasma for material processingeng
dc.typeArticle
dc.typeText
tib.accessRightsopenAccess
wgl.contributorINP
wgl.subjectChemieger
wgl.typeZeitschriftenartikelger

Files

Original bundle
Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
Characterization-of-the-Chemical-Kinetics.pdf
Size:
630.92 KB
Format:
Adobe Portable Document Format
Description:

Collections