The patterning toolbox FIB-o-mat: Exploiting the full potential of focused helium ions for nanofabrication

dc.bibliographicCitation.firstPage304eng
dc.bibliographicCitation.journalTitleBeilstein journal of nanotechnologyeng
dc.bibliographicCitation.lastPage318eng
dc.bibliographicCitation.volume12eng
dc.contributor.authorDeinhart, Victor
dc.contributor.authorKern, Lisa-Marie
dc.contributor.authorKirchhof, Jan N.
dc.contributor.authorJuergensen, Sabrina
dc.contributor.authorSturm, Joris
dc.contributor.authorKrauss, Enno
dc.contributor.authorFeichtner, Thorsten
dc.contributor.authorKovalchuk, Sviatoslav
dc.contributor.authorSchneider, Michael
dc.contributor.authorEngel, Dieter
dc.contributor.authorPfau, Bastian
dc.contributor.authorHecht, Bert
dc.contributor.authorBolotin, Kirill I.
dc.contributor.authorReich, Stephanie
dc.contributor.authorHöflich, Katja
dc.date.accessioned2022-03-16T12:12:34Z
dc.date.available2022-03-16T12:12:34Z
dc.date.issued2021
dc.description.abstractFocused beams of helium ions are a powerful tool for high-fidelity machining with spatial precision below 5 nm. Achieving such a high patterning precision over large areas and for different materials in a reproducible manner, however, is not trivial. Here, we introduce the Python toolbox FIB-o-mat for automated pattern creation and optimization, providing full flexibility to accomplish demanding patterning tasks. FIB-o-mat offers high-level pattern creation, enabling high-fidelity large-area patterning and systematic variations in geometry and raster settings. It also offers low-level beam path creation, providing full control over the beam movement and including sophisticated optimization tools. Three applications showcasing the potential of He ion beam nanofabrication for two-dimensional material systems and devices using FIB-o-mat are presented.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/8248
dc.identifier.urihttps://doi.org/10.34657/7286
dc.language.isoengeng
dc.publisherFrankfurt, M. : Beilstein-Institut zur Förderung der Chemischen Wissenschafteneng
dc.relation.doihttps://doi.org/10.3762/bjnano.12.25
dc.relation.essn2190-4286
dc.rights.licenseCC BY 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/eng
dc.subject.ddc620eng
dc.subject.ddc540eng
dc.subject.otherautomated patterningeng
dc.subject.otherfocused He ion beameng
dc.subject.othergrapheneeng
dc.subject.othermagnetic multilayerseng
dc.subject.othermechanical resonatoreng
dc.subject.otherpattern generationeng
dc.subject.otherplasmonic antennaseng
dc.subject.othertwo-dimensional materialseng
dc.titleThe patterning toolbox FIB-o-mat: Exploiting the full potential of focused helium ions for nanofabricationeng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorFBHeng
wgl.contributorMBIeng
wgl.subjectIngenieurwissenschafteneng
wgl.typeZeitschriftenartikeleng
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