Fluctuation-dissipation in thermoelectric sensors
dc.bibliographicCitation.firstPage | 26002 | |
dc.bibliographicCitation.issue | 2 | |
dc.bibliographicCitation.journalTitle | Europhysics Letters | eng |
dc.bibliographicCitation.volume | 141 | |
dc.contributor.author | Tran, N.A.M. | |
dc.contributor.author | Dutt, A.S. | |
dc.contributor.author | Pulumati, N.B. | |
dc.contributor.author | Reith, H. | |
dc.contributor.author | Hu, A. | |
dc.contributor.author | Dumont, A. | |
dc.contributor.author | Nielsch, K. | |
dc.contributor.author | Tremblay, A.-M.S. | |
dc.contributor.author | Schierning, G. | |
dc.contributor.author | Reulet, B. | |
dc.contributor.author | Szkopek, T. | |
dc.date.accessioned | 2023-06-02T15:03:43Z | |
dc.date.available | 2023-06-02T15:03:43Z | |
dc.date.issued | 2023 | |
dc.description.abstract | Thermoelectric materials exhibit correlated transport of charge and heat. The Johnson-Nyquist noise formula 4k B T R for the spectral density of voltage fluctuations accounts for fluctuations associated solely with Ohmic dissipation. Applying the fluctuation-dissipation theorem, we generalize the Johnson-Nyquist formula for thermoelectrics, finding an enhanced voltage fluctuation spectral density 4k B T R(1 + Z D T) at frequencies below a thermal cut-off frequency f T, where Z D T is the dimensionless thermoelectric device figure of merit. The origin of the enhancement in voltage noise is thermoelectric coupling of temperature fluctuations. We use a wideband , integrated thermoelectric micro-device to experimentally confirm our findings. Measuring the Z D T enhanced voltage noise, we experimentally resolve temperature fluctuations with a root mean square amplitude of at a mean temperature of 295 K. We find that thermoelectric devices can be used for thermometry with sufficient resolution to measure the fundamental temperature fluctuations described by the fluctuation-dissipation theorem. | eng |
dc.description.version | publishedVersion | eng |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/12340 | |
dc.identifier.uri | http://dx.doi.org/10.34657/11372 | |
dc.language.iso | eng | |
dc.publisher | Les-Ulis : EDP Science | |
dc.relation.doi | https://doi.org/10.1209/0295-5075/acb009 | |
dc.relation.essn | 1286-4854 | |
dc.relation.issn | 0295-5075 | |
dc.rights.license | CC BY 4.0 Unported | |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0 | |
dc.subject.ddc | 530 | |
dc.subject.other | thermal agitation | eng |
dc.subject.other | time | eng |
dc.title | Fluctuation-dissipation in thermoelectric sensors | eng |
dc.type | Article | eng |
dc.type | Text | eng |
tib.accessRights | openAccess | |
wgl.contributor | IFWD | |
wgl.subject | Physik | ger |
wgl.type | Zeitschriftenartikel | ger |
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