Physics inspired compact modelling of BiFeO3 based memristors

dc.bibliographicCitation.firstPage20490
dc.bibliographicCitation.volume12
dc.contributor.authorYarragolla, Sahitya
dc.contributor.authorDu, Nan
dc.contributor.authorHemke, Torben
dc.contributor.authorZhao, Xianyue
dc.contributor.authorChen, Ziang
dc.contributor.authorPolian, Ilia
dc.contributor.authorMussenbrock, Thomas
dc.date.accessioned2023-02-06T07:28:16Z
dc.date.available2023-02-06T07:28:16Z
dc.date.issued2022
dc.description.abstractWith the advent of the Internet of Things, nanoelectronic devices or memristors have been the subject of significant interest for use as new hardware security primitives. Among the several available memristors, BiFeO3 (BFO)-based electroforming-free memristors have attracted considerable attention due to their excellent properties, such as long retention time, self-rectification, intrinsic stochasticity, and fast switching. They have been actively investigated for use in physical unclonable function (PUF) key storage modules, artificial synapses in neural networks, nonvolatile resistive switches, and reconfigurable logic applications. In this work, we present a physics-inspired 1D compact model of a BFO memristor to understand its implementation for such applications (mainly PUFs) and perform circuit simulations. The resistive switching based on electric field-driven vacancy migration and intrinsic stochastic behaviour of the BFO memristor are modelled using the cloud-in-a-cell scheme. The experimental current–voltage characteristics of the BFO memristor are successfully reproduced. The response of the BFO memristor to changes in electrical properties, environmental properties (such as temperature) and stress are analyzed and consistant with experimental results.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/11226
dc.identifier.urihttp://dx.doi.org/10.34657/10262
dc.language.isoeng
dc.publisher[London] : Macmillan Publishers Limited, part of Springer Nature
dc.relation.doihttps://doi.org/10.1038/s41598-022-24439-4
dc.relation.essn2045-2322
dc.relation.ispartofseriesScientific reports 12 (2022)
dc.rights.licenseCC BY 4.0 Unported
dc.rights.urihttps://creativecommons.org/licenses/by/4.0
dc.subjectcell viabilityeng
dc.subjectelectric fieldeng
dc.subjectphysicseng
dc.subjectphysiological stresseng
dc.subjectsimulationeng
dc.subjectstochastic modeleng
dc.subject.ddc500
dc.subject.ddc600
dc.titlePhysics inspired compact modelling of BiFeO3 based memristorseng
dc.typearticle
dc.typeText
dcterms.bibliographicCitation.journalTitleScientific reports
tib.accessRightsopenAccess
wgl.contributorIPHT
wgl.subjectPhysikger
wgl.typeZeitschriftenartikelger
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