Physics inspired compact modelling of BiFeO3 based memristors

dc.bibliographicCitation.firstPage20490
dc.bibliographicCitation.journalTitleScientific reportseng
dc.bibliographicCitation.volume12
dc.contributor.authorYarragolla, Sahitya
dc.contributor.authorDu, Nan
dc.contributor.authorHemke, Torben
dc.contributor.authorZhao, Xianyue
dc.contributor.authorChen, Ziang
dc.contributor.authorPolian, Ilia
dc.contributor.authorMussenbrock, Thomas
dc.date.accessioned2023-02-06T07:28:16Z
dc.date.available2023-02-06T07:28:16Z
dc.date.issued2022
dc.description.abstractWith the advent of the Internet of Things, nanoelectronic devices or memristors have been the subject of significant interest for use as new hardware security primitives. Among the several available memristors, BiFeO3 (BFO)-based electroforming-free memristors have attracted considerable attention due to their excellent properties, such as long retention time, self-rectification, intrinsic stochasticity, and fast switching. They have been actively investigated for use in physical unclonable function (PUF) key storage modules, artificial synapses in neural networks, nonvolatile resistive switches, and reconfigurable logic applications. In this work, we present a physics-inspired 1D compact model of a BFO memristor to understand its implementation for such applications (mainly PUFs) and perform circuit simulations. The resistive switching based on electric field-driven vacancy migration and intrinsic stochastic behaviour of the BFO memristor are modelled using the cloud-in-a-cell scheme. The experimental current–voltage characteristics of the BFO memristor are successfully reproduced. The response of the BFO memristor to changes in electrical properties, environmental properties (such as temperature) and stress are analyzed and consistant with experimental results.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/11226
dc.identifier.urihttp://dx.doi.org/10.34657/10262
dc.language.isoeng
dc.publisher[London] : Macmillan Publishers Limited, part of Springer Nature
dc.relation.doihttps://doi.org/10.1038/s41598-022-24439-4
dc.relation.essn2045-2322
dc.rights.licenseCC BY 4.0 Unported
dc.rights.urihttps://creativecommons.org/licenses/by/4.0
dc.subject.ddc500
dc.subject.ddc600
dc.subject.othercell viabilityeng
dc.subject.otherelectric fieldeng
dc.subject.otherphysicseng
dc.subject.otherphysiological stresseng
dc.subject.othersimulationeng
dc.subject.otherstochastic modeleng
dc.titlePhysics inspired compact modelling of BiFeO3 based memristorseng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccess
wgl.contributorIPHT
wgl.subjectPhysikger
wgl.typeZeitschriftenartikelger
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