Scanning X-ray nanodiffraction: From the experimental approach towards spatially resolved scattering simulations
dc.bibliographicCitation.journalTitle | Nanoscale Research Letters | eng |
dc.bibliographicCitation.volume | 7 | |
dc.contributor.author | Dubslaff, Martin | |
dc.contributor.author | Hanke, Michael | |
dc.contributor.author | Patommel, Jens | |
dc.contributor.author | Hoppe, Robert | |
dc.contributor.author | Schroer, Christian G. | |
dc.contributor.author | Schöder, Sebastian | |
dc.contributor.author | Burghammer, Manfred | |
dc.date.accessioned | 2019-03-22T03:00:43Z | |
dc.date.available | 2019-06-28T12:39:08Z | |
dc.date.issued | 2012 | |
dc.description.abstract | An enhancement on the method of X-ray diffraction simulations for applications using nanofocused hard X-ray beams is presented. We combine finite element method, kinematical scattering calculations, and a spot profile of the X-ray beam to simulate the diffraction of definite parts of semiconductor nanostructures. The spot profile could be acquired experimentally by X-ray ptychography. Simulation results are discussed and compared with corresponding X-ray nanodiffraction experiments on single SiGe dots and dot molecules. | |
dc.description.version | publishedVersion | eng |
dc.format | application/pdf | |
dc.identifier.uri | https://doi.org/10.34657/1651 | |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/4196 | |
dc.language.iso | eng | eng |
dc.publisher | London : BioMed Central | |
dc.relation.doi | https://doi.org/10.1186/1556-276X-7-553 | |
dc.rights.license | CC BY 2.0 Unported | eng |
dc.rights.uri | https://creativecommons.org/licenses/by/2.0/ | eng |
dc.subject.ddc | 530 | |
dc.subject.other | Quantum dots | eng |
dc.subject.other | Quantum dot molecules | eng |
dc.subject.other | X-ray nanodiffraction | eng |
dc.subject.other | X-ray scattering simulation | eng |
dc.subject.other | 68.65.Hb | eng |
dc.subject.other | 61.05.C- | eng |
dc.title | Scanning X-ray nanodiffraction: From the experimental approach towards spatially resolved scattering simulations | |
dc.type | Article | eng |
dc.type | Text | eng |
tib.accessRights | openAccess | eng |
wgl.contributor | PDI | eng |
wgl.subject | Physik | eng |
wgl.type | Zeitschriftenartikel | eng |
Files
Original bundle
1 - 1 of 1
Loading...
- Name:
- 1556-276X-7-553.pdf
- Size:
- 1.48 MB
- Format:
- Adobe Portable Document Format
- Description: