Understanding peculiarities in the optoelectronic characteristics of light emitting diodes based on (In,Ga)N/GaN nanowires

dc.bibliographicCitation.journalTitleApplied Physics Letterseng
dc.contributor.authorMusolino, Mattia
dc.contributor.authorTahraoui, Abbes
dc.contributor.authorLimbach, Friederich
dc.contributor.authorLähnemann, Jonas
dc.contributor.authorJahn, Uwe
dc.contributor.authorBrandt, Oliver
dc.contributor.authorGeelhaar, Lutz
dc.contributor.authorRiechert, Henning
dc.date.accessioned2016-03-24T17:37:20Z
dc.date.available2019-06-28T12:39:33Z
dc.date.issued2014
dc.description.abstractWe investigate the effect of the p-type top contact on the optoelectronic characteristics of light emitting diodes (LEDs) based on (In,Ga)N/GaN nanowire (NW) ensembles grown by molecular beam epitaxy on Si substrates. We compare devices fabricated with either Ni/Au or indium tin oxide (ITO) top contact. The NW-LEDs with ITO exhibit a number density of NWs emitting electroluminescence about ten times higher, significantly lower turn-on voltage and series resistance, and a relative external quantum efficiency more than one order of magnitude higher than the sample with Ni/Au. These results show that limitations in the performance of such devices reported so far can be overcome by improving the p-type top-contact.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/4302
dc.language.isoengeng
dc.publisherCambridge : arXiveng
dc.relation.urihttp://arxiv.org/abs/1410.3709
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dc.subject.ddc530eng
dc.titleUnderstanding peculiarities in the optoelectronic characteristics of light emitting diodes based on (In,Ga)N/GaN nanowireseng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorPDIeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
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