Shielding Effect on Flux Trapping in Pulsed-Field Magnetizing for Mg-B Bulk Magnet

dc.bibliographicCitation.firstPage012019eng
dc.bibliographicCitation.issue1eng
dc.bibliographicCitation.journalTitleJournal of physics : Conference Serieseng
dc.bibliographicCitation.volume1975eng
dc.contributor.authorOka, T.
dc.contributor.authorYamanaka, K.
dc.contributor.authorSudo, K.
dc.contributor.authorDadiel, L.
dc.contributor.authorOgawa, J.
dc.contributor.authorYokoyama, K.
dc.contributor.authorHäßler, W.
dc.contributor.authorNoudem, J.
dc.contributor.authorBerger, K.
dc.contributor.authorSakai, N.
dc.contributor.authorMiryala, M.
dc.contributor.authorMurakami, M.
dc.date.accessioned2022-03-23T08:39:07Z
dc.date.available2022-03-23T08:39:07Z
dc.date.issued2021
dc.description.abstractMgB2 superconducting bulk materials are characterized as simple and uniform metallic compounds, and capable of trapping field of non-distorted conical shapes. Although pulsed-field magnetization technique (PFM) is expected to be a cheap and an easy way to activate them, the heat generation due to the magnetic flux motion causes serious degradation of captured fields. The authors precisely estimated the flux trapping property of the bulk samples, found that the flux-shielding effect closely attributed to the sample dimensions. The magnetic field capturing of Ti-5.0wt% sample reached the highest value of 0.76 T. The applied field which reached the centre of the sample surface shifted from 1.0 T to 1.2 T with increasing sample thickness from 3.67 mm to 5.80 mm. This means that the shielding effect was enhanced with increasing the sample thickness. Moreover, Ti-addition affected the frequency of flux jump happenings. The occurrence of flux jumps was suppressed in 5.0wt%Ti-added sample. This means that the heat capacity of the compounds was promoted by Ti addition.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/8335
dc.identifier.urihttps://doi.org/10.34657/7373
dc.language.isoengeng
dc.publisherBristol : IOP Publ.eng
dc.relation.doihttps://doi.org/10.1088/1742-6596/1975/1/012019
dc.relation.essn1742-6596
dc.rights.licenseCC BY 3.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/eng
dc.subject.ddc530eng
dc.subject.otherMagnesium compoundseng
dc.subject.otherShieldingeng
dc.subject.otherSpecific heateng
dc.subject.otherSuperconducting materialseng
dc.subject.otherPulsed fieldseng
dc.subject.otherPulsed-field magnetization techniqueeng
dc.subject.otherSample surfaceeng
dc.subject.otherSample thicknesseng
dc.subject.otherShielding effecteng
dc.subject.otherSuperconducting bulkseng
dc.subject.otherTrapping fieldseng
dc.subject.otherTrapping propertieseng
dc.subject.otherBoron compoundseng
dc.titleShielding Effect on Flux Trapping in Pulsed-Field Magnetizing for Mg-B Bulk Magneteng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorIFWDeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
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