Reciprocal space slicing: A time-efficient approach to femtosecond x-ray diffraction
dc.bibliographicCitation.firstPage | 014302 | eng |
dc.bibliographicCitation.issue | 1 | eng |
dc.bibliographicCitation.journalTitle | Structural dynamics | eng |
dc.bibliographicCitation.volume | 8 | eng |
dc.contributor.author | Zeuschner, S.P. | |
dc.contributor.author | Mattern, M. | |
dc.contributor.author | Pudell, J.-E. | |
dc.contributor.author | von Reppert, A. | |
dc.contributor.author | Rössle, M. | |
dc.contributor.author | Leitenberger, W. | |
dc.contributor.author | Schwarzkopf, J. | |
dc.contributor.author | Boschker, J.E. | |
dc.contributor.author | Herzog, M. | |
dc.contributor.author | Bargheer, M. | |
dc.date.accessioned | 2022-04-20T12:50:52Z | |
dc.date.available | 2022-04-20T12:50:52Z | |
dc.date.issued | 2021 | |
dc.description.abstract | An experimental technique that allows faster assessment of out-of-plane strain dynamics of thin film heterostructures via x-ray diffraction is presented. In contrast to conventional high-speed reciprocal space-mapping setups, our approach reduces the measurement time drastically due to a fixed measurement geometry with a position-sensitive detector. This means that neither the incident (ω) nor the exit ( 2θ ) diffraction angle is scanned during the strain assessment via x-ray diffraction. Shifts of diffraction peaks on the fixed x-ray area detector originate from an out-of-plane strain within the sample. Quantitative strain assessment requires the determination of a factor relating the observed shift to the change in the reciprocal lattice vector. The factor depends only on the widths of the peak along certain directions in reciprocal space, the diffraction angle of the studied reflection, and the resolution of the instrumental setup. We provide a full theoretical explanation and exemplify the concept with picosecond strain dynamics of a thin layer of NbO2. | eng |
dc.description.version | publishedVersion | eng |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/8749 | |
dc.identifier.uri | https://doi.org/10.34657/7787 | |
dc.language.iso | eng | eng |
dc.publisher | Melville, NY : AIP Publishing LLC | eng |
dc.relation.doi | https://doi.org/10.1063/4.0000040 | |
dc.relation.essn | 2329-7778 | |
dc.rights.license | CC BY 4.0 Unported | eng |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | eng |
dc.subject.ddc | 530 | eng |
dc.subject.ddc | 500 | eng |
dc.subject.other | Niobium oxide | eng |
dc.subject.other | Optical sensors | eng |
dc.subject.other | Strain | eng |
dc.subject.other | X ray diffraction | eng |
dc.subject.other | Diffraction angle | eng |
dc.subject.other | Diffraction peaks | eng |
dc.subject.other | Experimental techniques | eng |
dc.subject.other | Measurement geometry | eng |
dc.subject.other | Measurement time | eng |
dc.subject.other | Position-Sensitive Detectors | eng |
dc.subject.other | Reciprocal lattice vectors | eng |
dc.subject.other | Reciprocal space mapping | eng |
dc.subject.other | X ray detectors | eng |
dc.title | Reciprocal space slicing: A time-efficient approach to femtosecond x-ray diffraction | eng |
dc.type | Article | eng |
dc.type | Text | eng |
tib.accessRights | openAccess | eng |
wgl.contributor | IKZ | eng |
wgl.subject | Physik | eng |
wgl.type | Zeitschriftenartikel | eng |
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