Towards Oxide Electronics: a Roadmap

dc.bibliographicCitation.firstPage1eng
dc.bibliographicCitation.volume482eng
dc.contributor.authorColl, M.
dc.contributor.authorFontcuberta, J.
dc.contributor.authorAlthammer, M.
dc.contributor.authorBibes, M.
dc.contributor.authorBoschker, H.
dc.contributor.authorCalleja, A.
dc.contributor.authorCheng, G.
dc.contributor.authorCuoco, M.
dc.contributor.authorDittmann, R.
dc.contributor.authorDkhil, B.
dc.contributor.authorEl Baggari, I.
dc.contributor.authorFanciulli, M.
dc.contributor.authorFina, I.
dc.contributor.authorFortunato, E.
dc.contributor.authorFrontera, C.
dc.contributor.authorFujita, S.
dc.contributor.authorGarcia, V.
dc.contributor.authorGoennenwein, S.T.B.
dc.contributor.authorGranqvist, C.-G.
dc.contributor.authorGrollier, J.
dc.contributor.authorGross, R.
dc.contributor.authorHagfeldt, A.
dc.contributor.authorHerranz, G.
dc.contributor.authorHono, K.
dc.contributor.authorHouwman, E.
dc.contributor.authorHuijben, M.
dc.contributor.authorKalaboukhov, A.
dc.contributor.authorKeeble, D.J.
dc.contributor.authorKoster, G.
dc.contributor.authorKourkoutis, L.F.
dc.contributor.authorLevy, J.
dc.contributor.authorLira-Cantu, M.
dc.contributor.authorMacManus-Driscoll, J.L.
dc.contributor.authorMannhart, J.
dc.contributor.authorMartins, R.
dc.contributor.authorMenzel, S.
dc.contributor.authorMikolajick, T.
dc.contributor.authorNapari, M.
dc.contributor.authorNguyen, M.D.
dc.contributor.authorNiklasson, G.
dc.contributor.authorPaillard, C.
dc.contributor.authorPanigrahi, S.
dc.contributor.authorRijnders, G.
dc.contributor.authorSánchez, F.
dc.contributor.authorSanchis, P.
dc.contributor.authorSanna, S.
dc.contributor.authorSchlom, D.G.
dc.contributor.authorSchroeder, U.
dc.contributor.authorShen, K.M.
dc.contributor.authorSiemon, A.
dc.contributor.authorSpreitzer, M.
dc.contributor.authorSukegawa, H.
dc.contributor.authorTamayo, R.
dc.contributor.authorvan den Brink, J.
dc.contributor.authorPryds, N.
dc.contributor.authorGranozio, F.M.
dc.date.accessioned2020-07-18T06:12:35Z
dc.date.available2020-07-18T06:12:35Z
dc.date.issued2019
dc.description.abstract[No abstract available]eng
dc.description.sponsorshipLeibniz_Fondseng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://doi.org/10.34657/3597
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/4968
dc.language.isoengeng
dc.publisherAmsterdam : Elsevier B.V.eng
dc.relation.doihttps://doi.org/10.1016/j.apsusc.2019.03.312
dc.relation.ispartofseriesApplied Surface Science 482 (2019)eng
dc.relation.issn0169-4332
dc.rights.licenseCC BY-NC-ND 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/eng
dc.subjectCMOSeng
dc.subjectoxide filmseng
dc.subjectheterostructureseng
dc.subject.ddc530eng
dc.titleTowards Oxide Electronics: a Roadmapeng
dc.typearticleeng
dc.typeTexteng
dcterms.bibliographicCitation.journalTitleApplied Surface Scienceeng
tib.accessRightsopenAccesseng
wgl.contributorIFWDeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
Files
Original bundle
Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
Coll et al 2019, Towards Oxide Electronics.pdf
Size:
11.27 MB
Format:
Adobe Portable Document Format
Description:
Collections