Spatially controlled epitaxial growth of 2D heterostructures via defect engineering using a focused He ion beam

dc.bibliographicCitation.firstPage70eng
dc.bibliographicCitation.journalTitlenpj 2D materials and applicationseng
dc.bibliographicCitation.volume5eng
dc.contributor.authorHeilmann, Martin
dc.contributor.authorDeinhart, Victor
dc.contributor.authorTahraoui, Abbes
dc.contributor.authorHöflich, Katja
dc.contributor.authorLopes, J. Marcelo J.
dc.date.accessioned2022-03-31T08:37:50Z
dc.date.available2022-03-31T08:37:50Z
dc.date.issued2021
dc.description.abstractThe combination of two-dimensional (2D) materials into heterostructures enables the formation of atomically thin devices with designed properties. To achieve a high-density, bottom-up integration, the growth of these 2D heterostructures via van der Waals epitaxy (vdWE) is an attractive alternative to the currently mostly employed mechanical transfer, which is problematic in terms of scaling and reproducibility. Controlling the location of the nuclei formation remains a key challenge in vdWE. Here, a focused He ion beam is used to deterministically place defects in graphene substrates, which serve as preferential nucleation sites for the growth of insulating, 2D hexagonal boron nitride (h-BN). Therewith a mask-free, selective-area vdWE (SAvdWE) is demonstrated, in which nucleation yield and crystal quality of h-BN are controlled by the ion beam parameters used for defect formation. Moreover, h-BN grown via SAvdWE is shown to exhibit electron tunneling characteristics comparable to those of mechanically transferred layers, thereby lying the foundation for a reliable, high-density array fabrication of 2D heterostructures for device integration via defect engineering in 2D substrates.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/8481
dc.identifier.urihttps://doi.org/10.34657/7519
dc.language.isoengeng
dc.publisherLondon : Nature Publishing Groupeng
dc.relation.doihttps://doi.org/10.1038/s41699-021-00250-z
dc.relation.essn2397-7132
dc.rights.licenseCC BY 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/eng
dc.subject.ddc660eng
dc.subject.ddc670eng
dc.subject.otherBoron nitrideeng
dc.subject.otherCrystallizationeng
dc.subject.otherDefectseng
dc.subject.otherElectron tunnelingeng
dc.subject.otherHeliumeng
dc.subject.otherIII-V semiconductorseng
dc.subject.otherIon beamseng
dc.subject.otherIonseng
dc.subject.otherNucleationeng
dc.subject.otherSubstrateseng
dc.subject.otherVan der Waals forceseng
dc.subject.otherCrystal qualitieseng
dc.subject.otherDefect engineeringeng
dc.subject.otherDevice integrationeng
dc.subject.otherGraphene substrateseng
dc.subject.otherHigh-density arrayseng
dc.subject.otherTunneling characteristicseng
dc.subject.otherTwo Dimensional (2 D)eng
dc.subject.otherVan der Waals epitaxyeng
dc.subject.otherQuality controleng
dc.titleSpatially controlled epitaxial growth of 2D heterostructures via defect engineering using a focused He ion beameng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorPDIeng
wgl.subjectChemieeng
wgl.typeZeitschriftenartikeleng
Files
Original bundle
Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
Spatially_controlled_epitaxial_growth_of_2D.pdf
Size:
3.35 MB
Format:
Adobe Portable Document Format
Description:
Collections