A liquid flatjet system for solution phase soft-x-ray spectroscopy

dc.bibliographicCitation.firstPage054301eng
dc.bibliographicCitation.issue5eng
dc.bibliographicCitation.journalTitleStructural dynamicseng
dc.bibliographicCitation.volume2eng
dc.contributor.authorEkimova, Maria
dc.contributor.authorQuevedo, Wilson
dc.contributor.authorFaubel, Manfred
dc.contributor.authorWernet, Philippe
dc.contributor.authorNibbering, Erik T. J.
dc.date.accessioned2022-07-22T05:45:18Z
dc.date.available2022-07-22T05:45:18Z
dc.date.issued2015
dc.description.abstractWe present a liquid flatjet system for solution phase soft-x-ray spectroscopy. The flatjet set-up utilises the phenomenon of formation of stable liquid sheets upon collision of two identical laminar jets. Colliding the two single water jets, coming out of the nozzles with 50 μm orifices, under an impact angle of 48° leads to double sheet formation, of which the first sheet is 4.6 mm long and 1.0 mm wide. The liquid flatjet operates fully functional under vacuum conditions (<10(-3) mbar), allowing soft-x-ray spectroscopy of aqueous solutions in transmission mode. We analyse the liquid water flatjet thickness under atmospheric pressure using interferomeric or mid-infrared transmission measurements and under vacuum conditions by measuring the absorbance of the O K-edge of water in transmission, and comparing our results with previously published data obtained with standing cells with Si3N4 membrane windows. The thickness of the first liquid sheet is found to vary between 1.4-3 μm, depending on the transverse and longitudinal position in the liquid sheet. We observe that the derived thickness is of similar magnitude under 1 bar and under vacuum conditions. A catcher unit facilitates the recycling of the solutions, allowing measurements on small sample volumes (∼10 ml). We demonstrate the applicability of this approach by presenting measurements on the N K-edge of aqueous NH4 (+). Our results suggest the high potential of using liquid flatjets in steady-state and time-resolved studies in the soft-x-ray regime.eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/9771
dc.identifier.urihttps://doi.org/10.34657/8809
dc.language.isoengeng
dc.publisherMelville, NY : AIP Publishing LLCeng
dc.relation.doihttps://doi.org/10.1063/1.4928715
dc.relation.essn2329-7778
dc.rights.licenseCC BY 3.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/eng
dc.subject.ddc530eng
dc.subject.ddc500eng
dc.subject.otherAtmospheric pressureeng
dc.subject.otherInfrared transmissioneng
dc.subject.otherLiquidseng
dc.subject.otherNitrogen compoundseng
dc.subject.otherSilicon compoundseng
dc.subject.otherTransmissionseng
dc.subject.otherX ray spectroscopyeng
dc.subject.otherX rayseng
dc.subject.otherHigh potentialeng
dc.subject.otherMid-infrared transmissioneng
dc.subject.otherSheet formationeng
dc.subject.otherSoft-X-ray spectroscopyeng
dc.subject.otherSolution phaseeng
dc.subject.otherTime resolved studieseng
dc.subject.otherTransmission modeeng
dc.subject.otherVacuum conditioneng
dc.subject.otherStable liquidseng
dc.subject.otherSolution miningeng
dc.titleA liquid flatjet system for solution phase soft-x-ray spectroscopyeng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorMBIeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
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