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- ItemFirst Terahertz-range Experiments on Pump – Probe Setup at Novosibirsk free Electron Laser(Amsterdam [u.a.] : Elsevier, 2016) Choporova, Yulia Yu.; Gerasimov, Vasily V.; Knyazev, Boris A.; Sergeev, Sergey M.; Shevchenko, Oleg A.; Zhukavin, Roman K.; Abrosimov, Nikolay V.; Kovalevsky, Konstantin A.; Ovchar, Vladimir K.; Hübers, Heinz-Wilhelm; Kulipanov, Gennady N.; Shastin, Valery N.; Schneider, Harald; Vinokurov, Nikolay A.A single-color pump-probe system has been commissioned at the Novosibirsk free electron laser. The laser emits a tunable monochromatic terahertz radiation. To prove the proper system operation, we investigated the time-resolved absorption of a sample of n-type germanium doped with antimony, which was previously investigated at the FELBE facility, in the temperature range from 5 to 40 K. The measured relaxation time amounted to about 1.7 ns, which agreed with the results obtained at the FELBE. The results of pump-probe measurements of non-equilibrium dynamics of hot electrons in the germanium crystal at cryogenic temperatures are presented for wavelengths of 105, 141 and 150 μm.
- ItemTowards a life-time-limited 8-octave-infrared photoconductive germanium detector(Bristol : IOP Publ., 2015) Pavlov, S.G.; Deßmann, N.; Pohl, A.; Abrosimov, N.V.; Mittendorff, M.; Winnerl, S.; Zhukavin, R.K; Tsyplenkov, V.V.; Shengurov, D.V.; Shastin, V.N.; Hübers, H.-W.Ultrafast, ultra-broad-band photoconductive detector based on heavily doped and highly compensated germanium has been demonstrated. Such a material demonstrates optical sensitivity in the more than 8 octaves, in the infrared, from about 2 mm to about 8 μm. The spectral sensitivity peaks up between 2 THz and 2.5 THz and is slowly reduced towards lower and higher frequencies. The life times of free electrons/holes measured by a pump-probe technique approach a few tenths of picoseconds and remain almost independent on the optical input intensity and on the temperature of a detector in the operation range. During operation, a detector is cooled down to liquid helium temperature but has been approved to detect, with a reduced sensitivity, up to liquid nitrogen temperature. The response time is shorter than 200 ps that is significantly faster than previously reported times.
- ItemTerahertz emission from lithium doped silicon under continuous wave interband optical excitation(Bristol : IOP Publ., 2015) Andrianov, A.V.; Zakhar'in, A.O.; Zhukavin, R.K.; Shastin, V.N.; Abrosimov, N.V.We report on experimental observation and study of terahertz emission from lithium doped silicon crystals under continuous wave band-to-band optical excitation. It is shown that radiative transitions of electrons from 2P excited states of lithium donor to the 1S(A1) donor ground state prevail in the emission spectrum. The terahertz emission occurs due to capture of nonequilibrium electrons to charged donors, which in turn are generated in the crystal as a result of impurity assisted electron-hole recombination. Besides the intracentre radiative transitions the terahertz emission spectrum exhibits also features at about 12.7 and 15.27 meV, which could be related to intraexciton transitions and transitions from the continuum to the free exciton ground state.
- ItemStudy on the Properties of High Purity Germanium Crystals(Bristol : IOP Publ., 2015) Yang, G.; Mei, H.; Guan, Y.T.; Wang, G.J.; Mei, D.M.; Irmscher, K.In the crystal growth lab of South Dakota University, we are growing high purity germanium (HPGe) crystals and using the grown crystals to make radiation detectors. As the detector grade HPGe crystals, they have to meet two critical requirements: an impurity level of ∼109 to 10 atoms /cm3 and a dislocation density in the range of ∼102 to 104 / cm3. In the present work, we have used the following four characterization techniques to investigate the properties of the grown crystals. First of all, an x-ray diffraction method was used to determine crystal orientation. Secondly, the van der Pauw Hall effect measurement was used to measure the electrical properties. Thirdly, a photo-thermal ionization spectroscopy (PTIS) was used to identify what the impurity atoms are in the crystal. Lastly, an optical microscope observation was used to measure dislocation density in the crystal. All of these characterization techniques have provided great helps to our crystal activities.
- ItemContactless processing of SiGe-melts in EML under reduced gravity([New York, NY] : Nature Publ. Group, 2016) Luo, Yuansu; Damaschke, Bernd; Schneider, Stephan; Lohöfer, Georg; Abrosimov, Nikolay; Czupalla, Matthias; Samwer, KonradThe processing of semiconductors based on electromagnetic levitation is a challenge, because this kind of materials shows a poor electrical conductivity. Here, we report the results of measurements of the thermophysical properties obtained recently from highly doped semiconductors Si1-x Ge x under microgravity conditions in the framework of parabola flight campaigns. Due to the limited time of about 20 s of microgravity especially Ge-rich samples with low melting temperatures were investigated. The measurements were performed contactlessly by video techniques with subsequent digital image processing. Linear and volume thermal expansion coefficients were measured hereby from image data. An anomaly of volume changes near the solidus temperature is visible. Viscosity and surface tension were determined by the oscillating drop technique using optic and electronic data. It was observed that the alloying of Si into Ge increases the surface tension of the melts. The viscosity is following an Arrhenius equation and shows a crossover temperature which separates simple liquid at high temperatures from cooperative liquid at low temperatures.
- ItemElectromechanical losses in carbon- and oxygen-containing bulk AlN single crystals(Amsterdam [u.a.] : Elsevier Science, 2019) Kogut, Iurii; Hartmann, Carsten; Gamov, Ivan; Suhak, Yuriy; Schulz, Michal; Schröder, Sebastian; Wollweber, Jürgen; Dittmar, Andrea; Irmscher, Klaus; Straubinger, Thomas; Bickermann, Matthias; Fritze, HolgerBulk single-crystalline aluminum nitride (AlN) is potentially a key component for low-loss high-temperature piezoelectric devices. However, the incorporation of electrically active impurities and defects during growth of AlN may adversely affect the performance of piezoelectric resonators especially at high temperatures. The electrical conductivity and electromechanical losses in bulk AlN single crystals are analyzed in the temperature range of 300–1200 K with respect to various contents of growth-related impurities in them. For AlN with [O]/[C] ≤ 1, an increase of electrical conductivity due to thermal activation of charge carriers in the temperature range of 850–1200 K has been observed and was determined to be a major contribution to electromechanical losses Q−1 rising up to maximum values of about 10−3 at 1200 K. As the oxygen content in AlN increased, the magnitude and the activation energy of high-temperature electrical conductivity increased. In oxygen-dominated AlN, two major thermally activated contributions to electromechanical losses were observed, namely, the anelastic relaxations of point defects at temperatures of 400–800 K and electrical conductivity at T > 800 K.