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- ItemCharge carrier density, mobility, and Seebeck coefficient of melt-grown bulk ZnGa2O4 single crystals(New York, NY : American Inst. of Physics, 2020) Boy, Johannes; Handwerg, Martin; Mitdank, Rüdiger; Galazka, Zbigniew; Fischer, Saskia F.The temperature dependence of the charge carrier density, mobility, and Seebeck coefficient of melt-grown, bulk ZnGa2O4 single crystals was measured between 10 K and 310 K. The electrical conductivity at room temperature is about σ = 286 S/cm due to a high electron concentration of n = 3.26 × 1019 cm−3 caused by unintentional doping. The mobility at room temperature is μ = 55 cm2/V s, whereas the scattering on ionized impurities limits the mobility to μ = 62 cm2/Vs for temperatures lower than 180 K. The Seebeck coefficient relative to aluminum at room temperature is SZnGa2O4−Al = (−125 ± 2) μV/K and shows a temperature dependence as expected for degenerate semiconductors. At low temperatures, around 60 K, we observed the maximum Seebeck coefficient due to the phonon drag effect. © 2020 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
- ItemExploring the intrinsic limit of the charge-carrier-induced increase of the Curie temperature of Lu- and La-doped EuO thin films(College Park, MD : APS, 2020) Held, R.; Mairoser, T.; Melville, A.; Mundy, J.A.; Holtz, M.E.; Hodash, D.; Wang, Z.; Heron, J.T.; Dacek, S.T.; Holländer, B.; Muller, D.A.; Schlom, D.G.Raising the Curie temperature TC of the highly spin-polarized semiconductor EuO by doping it with rare-earth elements is a strategy to make EuO more technologically relevant to spintronics. The increase of TC with free carrier density n and the surprisingly low dopant activation p, found in Gd-doped EuO thin films [Mairoser et al., Phys. Rev. Lett. 105, 257206 (2010)], raised the important question of whether TC could be considerably enhanced by increasing p. Using a low-temperature growth method for depositing high-quality Lu-doped EuO films we attain high dopant activation (p) values of up to 67%, effectively more than doubling p as compared to adsorption-controlled growth of Lu- and Gd-doped EuO. Relating n, p, and lattice compression of La- and Lu-doped EuO films grown at different temperatures to the TC of these samples allows us to identify several different mechanisms influencing TC and causing an experimental maximum in TC. In addition, scanning transmission electron microscopy in combination with electron energy loss spectroscopy measurements on La-doped EuO indicate that extensive dopant clustering is one, but not the sole reason for dopant deactivation in rare-earth doped EuO films.