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- ItemHigh-Resolution Inkjet Printing of Quantum Dot Light-Emitting Microdiode Arrays(Weinheim : Wiley-VCH Verlag, 2020) Yang, P.; Zhang, L.; Kang, D.J.; Strahl, R.; Kraus, T.The direct printing of microscale quantum dot light-emitting diodes (QLEDs) is a cost-effective alternative to the placement of pre-formed LEDs. The quality of printed QLEDs currently is limited by nonuniformities in droplet formation, wetting, and drying during inkjet printing. Here, optimal ink formulation which can suppress nonuniformities at the pixel and array levels is demonstrated. A solvent mixture is used to tune the ejected droplet size, ensure wetting, and provoke Marangoni flows that prevent coffee stain rings. Arrays of green QLED devices are printed at a resolution of 500 pixels in.−1 with a maximum luminance of ≈3000 cd m−2 and a peak current efficiency of 2.8 cd A−1. The resulting array quality is sufficient to print displays at state-of-the-art resolutions.
- ItemTopographical anisotropy and wetting of ground stainless steel surfaces(Basel : MDPI AG, 2012) Calvimontes, A.; Mauermann, M.; Bellmann, C.Microscopic and physico-chemical methods were used for a comprehensive surface characterization of different mechanically modified stainless steel surfaces. The surfaces were analyzed using high-resolution confocal microscopy, resulting in detailed information about the topographic properties. In addition, static water contact angle measurements were carried out to characterize the surface heterogeneity of the samples. The effect of morphological anisotropy on water contact angle anisotropy was investigated. The correlation between topography and wetting was studied by means of a model of wetting proposed in the present work, that allows quantifying the air volume of the interface water drop-stainless steel surface.
- ItemRemote Sensing Based Yield Estimation of Rice (Oryza Sativa L.) Using Gradient Boosted Regression in India(Basel : MDPI, 2021) Arumugam, Ponraj; Chemura, Abel; Schauberger, Bernhard; Gornott, ChristophAccurate and spatially explicit yield information is required to ensure farmers’ income and food security at local and national levels. Current approaches based on crop cutting experiments are expensive and usually too late for timely income stabilization measures like crop insurances. We, therefore, utilized a Gradient Boosted Regression (GBR), a machine learning technique, to estimate rice yields at ~500 m spatial resolution for rice-producing areas in India with potential application for near real-time estimates. We used resampled intermediate resolution (~5 km) images of the Moderate Resolution Imaging Spectroradiometer (MODIS) Leaf Area Index (LAI) and observed yields at the district level in India for calibrating GBR models. These GBRs were then used to downscale district yields to 500 m resolution. Downscaled yields were re-aggregated for validation against out-of-sample district yields not used for model training and an additional independent data set of block-level (below district-level) yields. Our downscaled and re-aggregated yields agree well with reported district-level observations from 2003 to 2015 (r = 0.85 & MAE = 0.15 t/ha). The model performance improved further when estimating separate models for different rice cropping densities (up to r = 0.93). An additional out-of-sample validation for the years 2016 and 2017, proved successful with r = 0.84 and r = 0.77, respectively. Simulated yield accuracy was higher in water-limited, rainfed agricultural systems. We conclude that this downscaling approach of rice yield estimation using GBR is feasible across India and may complement current approaches for timely rice yield estimation required by insurance companies and government agencies.
- ItemA high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis(Melville, NY : American Inst. of Physics, 2019) Wünsche, Martin; Fuchs, Silvio; Weber, Thomas; Nathanael, Jan; Abel, Johann J.; Reinhard, Julius; Wiesner, Felix; Hübner, Uwe; Skruszewicz, Slawomir J.; Paulus, Gerhard G.; Rödel, ChristianWe present a modular extreme ultraviolet (XUV) spectrometer system optimized for a broad spectral range of 12-41 nm (30-99 eV) with a high spectral resolution of λ/Δλ 784 ± 89. The spectrometer system has several operation modes for (1) XUV beam inspection, (2) angular spectral analysis, and (3) imaging spectroscopy. These options allow for a versatile use in high harmonic spectroscopy and XUV beam analysis. The high performance of the spectrometer is demonstrated using a novel cross-sectional imaging method called XUV coherence tomography. © 2019 Author(s).