A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis
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Date
2019
Volume
90
Issue
2
Journal
The Review of scientific instruments
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Publisher
Melville, NY : American Inst. of Physics
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Abstract
We present a modular extreme ultraviolet (XUV) spectrometer system optimized for a broad spectral range of 12-41 nm (30-99 eV) with a high spectral resolution of λ/Δλ 784 ± 89. The spectrometer system has several operation modes for (1) XUV beam inspection, (2) angular spectral analysis, and (3) imaging spectroscopy. These options allow for a versatile use in high harmonic spectroscopy and XUV beam analysis. The high performance of the spectrometer is demonstrated using a novel cross-sectional imaging method called XUV coherence tomography. © 2019 Author(s).
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Citation
Wünsche, M., Fuchs, S., Weber, T., Nathanael, J., Abel, J. J., Reinhard, J., et al. (2019). A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis (Melville, NY : American Inst. of Physics). Melville, NY : American Inst. of Physics. https://doi.org//10.1063/1.5054116
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CC BY 4.0 Unported