A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis
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Date
2019
Volume
90
Issue
2
Journal
Series Titel
Book Title
Publisher
Melville, NY : American Inst. of Physics
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Abstract
We present a modular extreme ultraviolet (XUV) spectrometer system optimized for a broad spectral range of 12-41 nm (30-99 eV) with a high spectral resolution of λ/Δλ 784 ± 89. The spectrometer system has several operation modes for (1) XUV beam inspection, (2) angular spectral analysis, and (3) imaging spectroscopy. These options allow for a versatile use in high harmonic spectroscopy and XUV beam analysis. The high performance of the spectrometer is demonstrated using a novel cross-sectional imaging method called XUV coherence tomography. © 2019 Author(s).
Description
Keywords
Spectral resolution, Ultraviolet spectrometers, Coherence tomography, Cross-sectional imaging, Extreme ultraviolet spectrometers, Extreme ultraviolets, High harmonics, High resolution, High spectral resolution, Imaging spectroscopy, Spectrum analysis
Citation
Wünsche, M., Fuchs, S., Weber, T., Nathanael, J., Abel, J. J., Reinhard, J., et al. (2019). A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis. 90(2). https://doi.org//10.1063/1.5054116
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License
CC BY 4.0 Unported