A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis
| dc.bibliographicCitation.firstPage | 023108 | eng |
| dc.bibliographicCitation.issue | 2 | eng |
| dc.bibliographicCitation.journalTitle | The Review of scientific instruments | eng |
| dc.bibliographicCitation.volume | 90 | eng |
| dc.contributor.author | Wünsche, Martin | |
| dc.contributor.author | Fuchs, Silvio | |
| dc.contributor.author | Weber, Thomas | |
| dc.contributor.author | Nathanael, Jan | |
| dc.contributor.author | Abel, Johann J. | |
| dc.contributor.author | Reinhard, Julius | |
| dc.contributor.author | Wiesner, Felix | |
| dc.contributor.author | Hübner, Uwe | |
| dc.contributor.author | Skruszewicz, Slawomir J. | |
| dc.contributor.author | Paulus, Gerhard G. | |
| dc.contributor.author | Rödel, Christian | |
| dc.date.accessioned | 2022-05-10T08:15:06Z | |
| dc.date.available | 2022-05-10T08:15:06Z | |
| dc.date.issued | 2019 | |
| dc.description.abstract | We present a modular extreme ultraviolet (XUV) spectrometer system optimized for a broad spectral range of 12-41 nm (30-99 eV) with a high spectral resolution of λ/Δλ 784 ± 89. The spectrometer system has several operation modes for (1) XUV beam inspection, (2) angular spectral analysis, and (3) imaging spectroscopy. These options allow for a versatile use in high harmonic spectroscopy and XUV beam analysis. The high performance of the spectrometer is demonstrated using a novel cross-sectional imaging method called XUV coherence tomography. © 2019 Author(s). | eng |
| dc.description.version | publishedVersion | eng |
| dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/8911 | |
| dc.identifier.uri | https://doi.org/10.34657/7949 | |
| dc.language.iso | eng | eng |
| dc.publisher | Melville, NY : American Inst. of Physics | eng |
| dc.relation.doi | https://doi.org/10.1063/1.5054116 | |
| dc.relation.essn | 1089-7623 | |
| dc.rights.license | CC BY 4.0 Unported | eng |
| dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | eng |
| dc.subject.ddc | 530 | eng |
| dc.subject.ddc | 620 | eng |
| dc.subject.other | Spectral resolution | eng |
| dc.subject.other | Ultraviolet spectrometers | eng |
| dc.subject.other | Coherence tomography | eng |
| dc.subject.other | Cross-sectional imaging | eng |
| dc.subject.other | Extreme ultraviolet spectrometers | eng |
| dc.subject.other | Extreme ultraviolets | eng |
| dc.subject.other | High harmonics | eng |
| dc.subject.other | High resolution | eng |
| dc.subject.other | High spectral resolution | eng |
| dc.subject.other | Imaging spectroscopy | eng |
| dc.subject.other | Spectrum analysis | eng |
| dc.title | A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis | eng |
| dc.type | Article | eng |
| dc.type | Text | eng |
| tib.accessRights | openAccess | eng |
| wgl.contributor | IPHT | eng |
| wgl.subject | Physik | eng |
| wgl.type | Zeitschriftenartikel | eng |
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