A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis

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dc.bibliographicCitation.firstPage023108eng
dc.bibliographicCitation.issue2eng
dc.bibliographicCitation.volume90eng
dc.contributor.authorWünsche, Martin
dc.contributor.authorFuchs, Silvio
dc.contributor.authorWeber, Thomas
dc.contributor.authorNathanael, Jan
dc.contributor.authorAbel, Johann J.
dc.contributor.authorReinhard, Julius
dc.contributor.authorWiesner, Felix
dc.contributor.authorHübner, Uwe
dc.contributor.authorSkruszewicz, Slawomir J.
dc.contributor.authorPaulus, Gerhard G.
dc.contributor.authorRödel, Christian
dc.date.accessioned2022-05-10T08:15:06Z
dc.date.available2022-05-10T08:15:06Z
dc.date.issued2019
dc.description.abstractWe present a modular extreme ultraviolet (XUV) spectrometer system optimized for a broad spectral range of 12-41 nm (30-99 eV) with a high spectral resolution of λ/Δλ 784 ± 89. The spectrometer system has several operation modes for (1) XUV beam inspection, (2) angular spectral analysis, and (3) imaging spectroscopy. These options allow for a versatile use in high harmonic spectroscopy and XUV beam analysis. The high performance of the spectrometer is demonstrated using a novel cross-sectional imaging method called XUV coherence tomography. © 2019 Author(s).eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/8911
dc.identifier.urihttps://doi.org/10.34657/7949
dc.language.isoengeng
dc.publisherMelville, NY : American Inst. of Physicseng
dc.relation.doihttps://doi.org/10.1063/1.5054116
dc.relation.essn1089-7623
dc.relation.ispartofseriesReview of Scientific Instruments 90 (2019), Nr. 2eng
dc.rights.licenseCC BY 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/eng
dc.subjectSpectral resolutioneng
dc.subjectUltraviolet spectrometerseng
dc.subjectCoherence tomographyeng
dc.subjectCross-sectional imagingeng
dc.subjectExtreme ultraviolet spectrometerseng
dc.subjectExtreme ultravioletseng
dc.subjectHigh harmonicseng
dc.subjectHigh resolutioneng
dc.subjectHigh spectral resolutioneng
dc.subjectImaging spectroscopyeng
dc.subjectSpectrum analysiseng
dc.subject.ddc530eng
dc.subject.ddc620eng
dc.titleA high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysiseng
dc.typearticleeng
dc.typeTexteng
dcterms.bibliographicCitation.journalTitleThe Review of scientific instrumentseng
tib.accessRightsopenAccesseng
wgl.contributorIPHTeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
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