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Version: publishedVersion × Subject: Phase locked loops ×

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    Charge pump design in 130 nm SiGe BiCMOS technology for low-noise fractional-N PLLs
    (München : European Geopyhsical Union, 2015) Kucharski, M.; Herzel, F.
    This paper presents a numerical comparison of charge pumps (CP) designed for a high linearity and a low noise to be used in a fractional-N phase-locked loop (PLL). We consider a PLL architecture, where two parallel CPs with DC offset are used. The CP for VCO fine tuning is biased at the output to keep the VCO gain constant. For this specific architecture, only one transistor per CP is relevant for phase detector linearity. This can be an nMOSFET, a pMOSFET or a SiGe HBT, depending on the design. The HBT-based CP shows the highest linearity, whereas all charge pumps show similar device noise. An internal supply regulator with low intrinsic device noise is included in the design optimization.
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    Phase noise and jitter modeling for fractional-N PLLs
    (Göttingen : Copernicus, 2007) Osmany, S.A.; Herzel, F.; Schmalz, K.; Winkler, W.
    We present an analytical phase noise model for fractional-N phase-locked loops (PLL) with emphasis on integrated RF synthesizers in the GHz range. The noise of the crystal reference, the voltage-controlled oscillator (VCO), the loop filter, the charge pump, and the sigma-delta modulator (SDM) is filtered by the PLL operation. We express the rms phase error (jitter) in terms of phase noise of the reference, the VCO phase noise and the third-order loop filter parameters. In addition, we consider OFDM systems, where the PLL phase noise is reduced by digital signal processing after down-conversion of the RF signal to baseband. The rms phase error is discussed as a function of the loop parameters. Our model drastically simplifies the noise optimization of the PLL loop dynamics.