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Now showing 1 - 7 of 7
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    Topography evolution of germanium thin films synthesized by pulsed laser deposition
    (New York, NY : American Inst. of Physics, 2017) Schumacher, P.; Mayr, S.G.; Rauschenbach, B.
    Germanium thin films were deposited by Pulsed Laser Deposition (PLD) onto single crystal Ge (100) and Si (100) substrates with a native oxide film on the surface. The topography of the surface was investigated by Atomic Force Microscopy (AFM) to evaluate the scaling behavior of the surface roughness of amorphous and polycrystalline Ge films grown on substrates with different roughnesses. Roughness evolution was interpreted within the framework of stochastic rate equations for thin film growth. Here the Kardar-Parisi-Zhang equation was used to describe the smoothening process. Additionally, a roughening regime was observed in which 3-dimensional growth occurred. Diffusion of the deposited Ge adatoms controlled the growth of the amorphous Ge thin films. The growth of polycrystalline thin Ge films was dominated by diffusion processes only in the initial stage of the growth.
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    A Printable Paste Based on a Stable n-Type Poly[Ni-tto] Semiconducting Polymer
    (Basel : MDPI, 2019) Tkachov, Roman; Stepien, Lukas; Greifzu, Moritz; Kiriy, Anton; Kiriy, Nataliya; Schüler, Tilman; Schmiel, Tino; López, Elena; Brückner, Frank; Leyens, Christoph
    Polynickeltetrathiooxalate (poly[Ni-tto]) is an n-type semiconducting polymer having outstanding thermoelectric characteristics and exhibiting high stability under ambient conditions. However, its insolubility limits its use in organic electronics. This work is devoted to the production of a printable paste based on a poly[Ni-tto]/PVDF composite by thoroughly grinding the powder in a ball mill. The resulting paste has high homogeneity and is characterized by rheological properties that are well suited to the printing process. High-precision dispenser printing allows one to apply both narrow lines and films of poly[Ni-tto]-composite with a high degree of smoothness. The resulting films have slightly better thermoelectric properties compared to the original polymer powder. A flexible, fully organic double-leg thermoelectric generator with six thermocouples was printed by dispense printing using the poly[Ni-tto]-composite paste as n-type material and a commercial PEDOT-PSS paste as p-type material. A temperature gradient of 100 K produces a power output of about 20 nW. © 2019 by the authors.
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    Dynamic Single-Fiber Pull-Out of Polypropylene Fibers Produced with Different Mechanical and Surface Properties for Concrete Reinforcement
    (Basel : MDPI, 2021) Wölfel, Enrico; Brünig, Harald; Curosu, Iurie; Mechtcherine, Viktor; Scheffler, Christina
    In strain-hardening cement-based composites (SHCC), polypropylene (PP) fibers are often used to provide ductility through micro crack-bridging, in particular when subjected to high loading rates. For the purposeful material design of SHCC, fundamental research is required to understand the failure mechanisms depending on the mechanical properties of the fibers and the fiber–matrix interaction. Hence, PP fibers with diameters between 10 and 30 µm, differing tensile strength levels and Young’s moduli, but also circular and trilobal cross-sections were produced using melt-spinning equipment. The structural changes induced by the drawing parameters during the spinning process and surface modification by sizing were assessed in single-fiber tensile experiments and differential scanning calorimetry (DSC) of the fiber material. Scanning electron microscopy (SEM), atomic force microscopy (AFM) and contact angle measurements were applied to determine the topographical and wetting properties of the fiber surface. The fiber–matrix interaction under quasi-static and dynamic loading was studied in single-fiber pull-out experiments (SFPO). The main findings of microscale characterization showed that increased fiber tensile strength in combination with enhanced mechanical interlocking caused by high surface roughness led to improved energy absorption under dynamic loading. Further enhancement could be observed in the change from a circular to a trilobal fiber cross-section.
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    Characteristics of diamond turned NiP smoothed with ion beam planarization technique
    (London : [Springer], 2017) Li, Yaguo; Takino, Hideo; Frost, Frank
    Background: Diamond turning is widely used in machining metals and semiconductors but the turning marks are incurred on machined components due to the mechanics of the technology. The marks are generally harmful to the systems comprising of the machined components. Therefore, the capability of ion beam planarization (IBP) to reduce turning marks of diamond turned metal surfaces was investigated using NiP as an example. Methods: The turning marks and thereby roughness was reduced by IBP with respect to different spatial wavelengths and amplitudes of turning marks. Different thickness of coating resist was also examined in order to find out the potential effects of resist thickness on the reduction of turning marks and roughness. Additionally, the effect of multiple planarization steps was also analyzed. Results: The spatial wavelength and depth of turning marks have only minor impact on the degree of surface roughness reduction. Thicker coating tends to achieve smoother surface after coating turned NiP while ion beam etching can keep surface roughness almost unchanged in our experiments. The surface roughness of diamond turned NiP drops exponentially with processing steps under experimented conditions. Using up to five IBP steps, the surface roughness can be reduced up to one order of magnitude (from Rq ~ 6.5 nm to Rq ~ 0.7 nm). Conclusions: IBP technique performs very well in reducing turning marks on diamond turned NiP surfaces. The surface roughness can be further improved by optimizing the properties of planarizing resist layer and coating processes to enhance the IBP technique as a final surface finishing technology.
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    Substrate-orientation dependence of β -Ga2O3 (100), (010), (001), and (2 ̄ 01) homoepitaxy by indium-mediated metal-exchange catalyzed molecular beam epitaxy (MEXCAT-MBE)
    (Melville, NY : AIP Publ., 2020) Mazzolini, P.; Falkenstein, A.; Wouters, C.; Schewski, R.; Markurt, T.; Galazka, Z.; Martin, M.; Albrecht, M.; Bierwagen, O.
    We experimentally demonstrate how In-mediated metal-exchange catalysis (MEXCAT) allows us to widen the deposition window for β-Ga2O3 homoepitaxy to conditions otherwise prohibitive for its growth via molecular beam epitaxy (e.g., substrate temperatures ≥800 °C) on the major substrate orientations, i.e., (010), (001), (2⎯⎯01), and (100) 6°-offcut. The obtained crystalline qualities, surface roughnesses, growth rates, and In-incorporation profiles are shown and compared with different experimental techniques. The growth rates, Γ, for fixed growth conditions are monotonously increasing with the surface free energy of the different orientations with the following order: Γ(010) > Γ(001) > Γ(2⎯⎯01) > Γ(100). Ga2O3 surfaces with higher surface free energy provide stronger bonds to the surface ad-atoms or ad-molecules, resulting in decreasing desorption, i.e., a higher incorporation/growth rate. The structural quality in the case of (2⎯⎯01), however, is compromised by twin domains due to the crystallography of this orientation. Notably, our study highlights β-Ga2O3 layers with high structural quality grown by MEXCAT-MBE not only in the most investigated (010) orientation but also in the (100) and (001) ones. In particular, MEXCAT on the (001) orientation results in both growth rate and structural quality comparable to the ones achievable with (010), and the limited incorporation of In associated with the MEXCAT deposition process does not change the insulating characteristics of unintentionally doped layers. The (001) surface is therefore suggested as a valuable alternative orientation for devices.
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    Nanostructures on fused silica surfaces produced by ion beam sputtering with Al co-deposition
    (Heidelberg [u.a.] : Springer, 2017) Liu, Ying; Hirsch, Dietmar; Fechner, Renate; Hong, Yilin; Fu, Shaojun; Frost, Frank; Rauschenbach, Bernd
    The ion beam sputtering (IBS) of smooth mono-elemental Si with impurity co-deposition is extended to a pre-rippled binary compound surface of fused silica (SiO2). The dependence of the rms roughness and the deposited amount of Al on the distance from the Al source under Ar+ IBS with Al co-deposition was investigated on smooth SiO2, pre-rippled SiO2, and smooth Si surfaces, using atomic force microscopy and X-ray photoelectron spectroscopy. Although the amounts of Al deposited on these three surfaces all decreased with increasing distance from the Al target, the morphology and rms roughness of the smooth Si surface did not demonstrate a strong distance dependence. In contrast to smooth Si, the rms roughness of both the smooth and pre-rippled SiO2 surfaces exhibited a similar distance evolution trend of increasing, decreasing, and final stabilization at the distance where the results were similar to those obtained without Al co-deposition. However, the pre-rippled SiO2 surfaces showed a stronger modulation of rms roughness than the smooth surfaces. At the incidence angles of 60° and 70°, dot-decorated ripples and roof-tiles were formed on the smooth SiO2 surfaces, respectively, whereas nanostructures of closely aligned grains and blazed facets were generated on the pre-rippled SiO2, respectively. The combination of impurity co-deposition with pre-rippled surfaces was found to facilitate the formation of novel types of nanostructures and morphological growth. The initial ripples act as a template to guide the preferential deposition of Al on the tops of the ripples or the ripple sides facing the Al wedge, but not in the valleys between the ripples, leading to 2D grains and quasi-blazed grating, which offer significant promise in optical applications. The rms roughness enhancement is attributed not to AlSi, but to AlOxFy compounds originating mainly from the Al source.
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    Seismic imaging of sandbox experiments – laboratory hardware setup and first reflection seismic sections
    (Göttingen : Copernicus Publ., 2013) Krawczyk, C.M.; Buddensiek, M.-L.; Oncken, O.; Kukowski, N.
    With the study and technical development introduced here, we combine analogue sandbox simulation techniques with seismic physical modelling of sandbox models. For that purpose, we designed and developed a new mini-seismic facility for laboratory use, comprising a seismic tank, a PC-driven control unit, a positioning system, and piezoelectric transducers used here for the first time in an array mode. To assess the possibilities and limits of seismic imaging of small-scale structures in sandbox models, different geometry setups were tested in the first 2-D experiments that also tested the proper functioning of the device and studied the seismo-elastic properties of the granular media used. Simple two-layer models of different materials and layer thicknesses as well as a more complex model comprising channels and shear zones were tested using different acquisition geometries and signal properties. We suggest using well sorted and well rounded grains with little surface roughness (glass beads). Source receiver-offsets less than 14 cm for imaging structures as small as 2.0–1.5 mm size have proven feasible. This is the best compromise between wide beam and high energy output, and is applicable with a consistent waveform. Resolution of the interfaces of layers of granular materials depends on the interface preparation rather than on the material itself. Flat grading of interfaces and powder coverage yields the clearest interface reflections. Finally, sandbox seismic sections provide images of high quality showing constant thickness layers as well as predefined channel structures and indications of the fault traces from shear zones. Since these were artificially introduced in our test models, they can be regarded as zones of disturbance rather than tectonic shear zones characterized by decompaction. The multiple-offset surveying introduced here, improves the quality with respect to S / N ratio and source signature even more; the maximum depth penetration in glass-bead layers thereby amounts to 5 cm. Thus, the presented mini-seismic device is already able to resolve structures within simple models of saturated porous media, so that multiple-offset seismic imaging of shallow sandbox models, that are structurally evolving, is generally feasible.