Lumped Parameter Model for Silicon Crystal Growth from Granulate Crucible

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Date
2020
Volume
55
Issue
8
Journal
Crystal research and technology : journal of experimental and industrial crystallography
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Publisher
Weinheim : Wiley-VCH
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Abstract

In the present paper, a lumped parameter model for the novel Silicon Granulate Crucible (SiGC) method is proposed, which is the basis for a future model-based control system for the process. The model is analytically deduced based on the hydromechanical, geometrical, and thermal conditions of the process. Experiments are conducted to identify unknown model parameters and to validate the model. The physical consistency of the model is verified using simulation studies and a prediction error of below 2% is reached. © 2020 The Authors. Published by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

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Lorenz-Meyer, M. N. L., Menzel, R., Dadzis, K., Nikiforova, A., & Riemann, H. (2020). Lumped Parameter Model for Silicon Crystal Growth from Granulate Crucible (Weinheim : Wiley-VCH). Weinheim : Wiley-VCH. https://doi.org//10.1002/crat.202000044
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CC BY 4.0 Unported