S-wave seismic imaging of near-surface sediments using tailored processing strategies

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Date
2020
Volume
173
Issue
Journal
Series Titel
Book Title
Publisher
Amsterdam [u.a.] : Elsevier Science
Abstract

Reflection seismic imaging using horizontally-polarized S-waves (SH) can increase resolution and it could be cost-efficient compared to the common use of P-waves. However, since S-wave application often delivers varying data quality, appropriate processing schemes are required for particular imaging and interpretation purposes. In this paper, we present four tailored processing strategies that are applied to SH-wave data acquired in an overdeepened Quaternary basin in the Alpine foreland, the Tannwald Basin. The applied processing schemes consist of (1) processing using a short automatic gain control window that enhances structural details and highlights small-scale structures, (2) offset restriction indicating that relative small offsets are sufficient for adequate imaging, which offers reduced field operation costs, (3) coherency-enhancement that reveals large-scale structures for interpretation, and (4) adapted amplitude scaling that enables structural comparison of P-wave and S-wave seismic sections. With respect to P-wave data measured on the same profile, we demonstrate the benefits of the S-wave seismic reflection method. P-waves offer robust imaging results, but S-waves double the resolution, better depict shallow reflections, and may image reflectors in areas where the P-wave struggles. At least for the Tannwald Basin, S-wave imaging is also more cost-efficient than P-wave imaging. © 2020 The Authors

Description
Keywords
High-resolution, Horizontally-polarized shear wave, Near-surface structures, Overdeepened valley, SH-wave, Tannwald Basin
Citation
Burschil, T., & Buness, H. (2020). S-wave seismic imaging of near-surface sediments using tailored processing strategies. 173. https://doi.org//10.1016/j.jappgeo.2019.103927
License
CC BY-NC-ND 4.0 Unported