Redox equilibria of polyvalent elements in binary Na2O · xSiO2 melts
dc.bibliographicCitation.firstPage | 105 | |
dc.bibliographicCitation.journalTitle | Glass Science and Technology | eng |
dc.bibliographicCitation.lastPage | 110 | |
dc.bibliographicCitation.volume | 73 | |
dc.contributor.author | Gönna, Gordon von der | |
dc.contributor.author | Rüssel, Christian | |
dc.date.accessioned | 2024-01-05T15:40:51Z | |
dc.date.available | 2024-01-05T15:40:51Z | |
dc.date.issued | 2000 | |
dc.description.abstract | Glass melts with the basic compositions (in mol%) of 15 Na2O ∙ 85 SiO2 and Na2O ∙ 2 SiO2 were doped with oxides of various polyvalent elements. At temperatures in the range of 800 to 1550°C, square-wave voltammograms were recorded, which exhibit distinct maxima attributed to respective reduction processes. The following redox steps were observed: Sb5+/Sb3+, Sb3+/Sb0, As5+/As3+, As3+/As0, Cu+/Cu0, V5+/V4+, V4+/V3+, Cr6+/Cr3+, Cr3+/Cr2+, Fe3+/Fe2+ and Ti4+/Ti3+. Peak potentials measured in the Na2O ∙ 2 SiO2 glass depended linearly on temperature, while those of the 15 Na2O ∙ 85 SiO2 melt were affected by the crystallization of cristobalit at temperatures < 1300°C. Redox equilibria in the alkali-rich Na2O ∙ 2 SiO2 melt were generally shifted to the oxidized state by comparison to those measured in the 15 Na2O ∙ 85 SiO2 melt. | eng |
dc.description.version | publishedVersion | |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/14060 | |
dc.identifier.uri | https://doi.org/10.34657/13090 | |
dc.language.iso | eng | |
dc.publisher | Offenbach : Verlag der Deutschen Glastechnischen Gesellschaft | |
dc.relation.issn | 0946-7475 | |
dc.rights.license | CC BY 3.0 DE | |
dc.rights.uri | https://creativecommons.org/licenses/by/3.0/de/ | |
dc.subject.ddc | 660 | |
dc.title | Redox equilibria of polyvalent elements in binary Na2O · xSiO2 melts | eng |
dc.type | Article | eng |
dc.type | Text | eng |
tib.accessRights | openAccess |
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