Drift–diffusion simulation of S-shaped current–voltage relations for organic semiconductor devices

dc.bibliographicCitation.firstPage1164eng
dc.bibliographicCitation.issue3eng
dc.bibliographicCitation.journalTitleJournal of computational electronicseng
dc.bibliographicCitation.lastPage1174eng
dc.bibliographicCitation.volume19eng
dc.contributor.authorDoan, Duy Hai
dc.contributor.authorFischer, Axel
dc.contributor.authorFuhrmann, Jürgen
dc.contributor.authorGlitzky, Annegret
dc.contributor.authorLiero, Matthias
dc.date.accessioned2021-11-15T08:43:56Z
dc.date.available2021-11-15T08:43:56Z
dc.date.issued2020
dc.description.abstractWe present an electrothermal drift–diffusion model for organic semiconductor devices with Gauss–Fermi statistics and positive temperature feedback for the charge carrier mobilities. We apply temperature-dependent Ohmic contact boundary conditions for the electrostatic potential and discretize the system by a finite volume based generalized Scharfetter–Gummel scheme. Using path-following techniques, we demonstrate that the model exhibits S-shaped current–voltage curves with regions of negative differential resistance, which were only recently observed experimentally. © 2020, The Author(s).eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/7280
dc.identifier.urihttps://doi.org/10.34657/6327
dc.language.isoengeng
dc.publisherDordrecht : Springer Science + Business Media B.V.eng
dc.relation.doihttps://doi.org/10.1007/s10825-020-01505-6
dc.relation.essn1572-8137
dc.rights.licenseCC BY 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/eng
dc.subject.ddc004eng
dc.subject.otherFinite volumeseng
dc.subject.otherGeneralized Scharfetter–Gummel schemeeng
dc.subject.otherNon-isothermal drift–diffusioneng
dc.subject.otherOrganic semiconductorseng
dc.subject.otherPath-followingeng
dc.titleDrift–diffusion simulation of S-shaped current–voltage relations for organic semiconductor deviceseng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorWIASeng
wgl.subjectInformatikeng
wgl.typeZeitschriftenartikeleng
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