Charge carrier density, mobility, and Seebeck coefficient of melt-grown bulk ZnGa2O4 single crystals
dc.bibliographicCitation.firstPage | 2847 | eng |
dc.bibliographicCitation.issue | 5 | eng |
dc.bibliographicCitation.journalTitle | AIP Advances | eng |
dc.bibliographicCitation.volume | 10 | eng |
dc.contributor.author | Boy, Johannes | |
dc.contributor.author | Handwerg, Martin | |
dc.contributor.author | Mitdank, Rüdiger | |
dc.contributor.author | Galazka, Zbigniew | |
dc.contributor.author | Fischer, Saskia F. | |
dc.date.accessioned | 2021-08-31T13:25:25Z | |
dc.date.available | 2021-08-31T13:25:25Z | |
dc.date.issued | 2020 | |
dc.description.abstract | The temperature dependence of the charge carrier density, mobility, and Seebeck coefficient of melt-grown, bulk ZnGa2O4 single crystals was measured between 10 K and 310 K. The electrical conductivity at room temperature is about σ = 286 S/cm due to a high electron concentration of n = 3.26 × 1019 cm−3 caused by unintentional doping. The mobility at room temperature is μ = 55 cm2/V s, whereas the scattering on ionized impurities limits the mobility to μ = 62 cm2/Vs for temperatures lower than 180 K. The Seebeck coefficient relative to aluminum at room temperature is SZnGa2O4−Al = (−125 ± 2) μV/K and shows a temperature dependence as expected for degenerate semiconductors. At low temperatures, around 60 K, we observed the maximum Seebeck coefficient due to the phonon drag effect. © 2020 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). | eng |
dc.description.version | publishedVersion | eng |
dc.identifier.uri | https://oa.tib.eu/renate/handle/123456789/6642 | |
dc.identifier.uri | https://doi.org/10.34657/5689 | |
dc.language.iso | eng | eng |
dc.publisher | New York, NY : American Inst. of Physics | eng |
dc.relation.doi | https://doi.org/10.1063/5.0002847 | |
dc.relation.essn | 2158-3226 | |
dc.rights.license | CC BY 4.0 Unported | eng |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | eng |
dc.subject.ddc | 530 | eng |
dc.subject.other | Carrier concentration | eng |
dc.subject.other | Crystal impurities | eng |
dc.subject.other | Gallium compounds | eng |
dc.subject.other | Hall mobility | eng |
dc.subject.other | Seebeck coefficient | eng |
dc.subject.other | Semiconductor doping | eng |
dc.subject.other | Single crystals | eng |
dc.subject.other | Temperature distribution | eng |
dc.subject.other | Zinc compounds | eng |
dc.subject.other | Degenerate semiconductors | eng |
dc.subject.other | Electrical conductivity | eng |
dc.subject.other | High electron concentration | eng |
dc.subject.other | Ionized impurities | eng |
dc.subject.other | Low temperatures | eng |
dc.subject.other | Phonon drag effects | eng |
dc.subject.other | Temperature dependence | eng |
dc.subject.other | Unintentional doping | eng |
dc.subject.other | Hole mobility | eng |
dc.title | Charge carrier density, mobility, and Seebeck coefficient of melt-grown bulk ZnGa2O4 single crystals | eng |
dc.type | Article | eng |
dc.type | Text | eng |
tib.accessRights | openAccess | eng |
wgl.contributor | IKZ | eng |
wgl.subject | Physik | eng |
wgl.type | Zeitschriftenartikel | eng |
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