Charge carrier density, mobility, and Seebeck coefficient of melt-grown bulk ZnGa2O4 single crystals

dc.bibliographicCitation.firstPage2847eng
dc.bibliographicCitation.issue5eng
dc.bibliographicCitation.journalTitleAIP Advanceseng
dc.bibliographicCitation.volume10eng
dc.contributor.authorBoy, Johannes
dc.contributor.authorHandwerg, Martin
dc.contributor.authorMitdank, Rüdiger
dc.contributor.authorGalazka, Zbigniew
dc.contributor.authorFischer, Saskia F.
dc.date.accessioned2021-08-31T13:25:25Z
dc.date.available2021-08-31T13:25:25Z
dc.date.issued2020
dc.description.abstractThe temperature dependence of the charge carrier density, mobility, and Seebeck coefficient of melt-grown, bulk ZnGa2O4 single crystals was measured between 10 K and 310 K. The electrical conductivity at room temperature is about σ = 286 S/cm due to a high electron concentration of n = 3.26 × 1019 cm−3 caused by unintentional doping. The mobility at room temperature is μ = 55 cm2/V s, whereas the scattering on ionized impurities limits the mobility to μ = 62 cm2/Vs for temperatures lower than 180 K. The Seebeck coefficient relative to aluminum at room temperature is SZnGa2O4−Al = (−125 ± 2) μV/K and shows a temperature dependence as expected for degenerate semiconductors. At low temperatures, around 60 K, we observed the maximum Seebeck coefficient due to the phonon drag effect. © 2020 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).eng
dc.description.versionpublishedVersioneng
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/6642
dc.identifier.urihttps://doi.org/10.34657/5689
dc.language.isoengeng
dc.publisherNew York, NY : American Inst. of Physicseng
dc.relation.doihttps://doi.org/10.1063/5.0002847
dc.relation.essn2158-3226
dc.rights.licenseCC BY 4.0 Unportedeng
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/eng
dc.subject.ddc530eng
dc.subject.otherCarrier concentrationeng
dc.subject.otherCrystal impuritieseng
dc.subject.otherGallium compoundseng
dc.subject.otherHall mobilityeng
dc.subject.otherSeebeck coefficienteng
dc.subject.otherSemiconductor dopingeng
dc.subject.otherSingle crystalseng
dc.subject.otherTemperature distributioneng
dc.subject.otherZinc compoundseng
dc.subject.otherDegenerate semiconductorseng
dc.subject.otherElectrical conductivityeng
dc.subject.otherHigh electron concentrationeng
dc.subject.otherIonized impuritieseng
dc.subject.otherLow temperatureseng
dc.subject.otherPhonon drag effectseng
dc.subject.otherTemperature dependenceeng
dc.subject.otherUnintentional dopingeng
dc.subject.otherHole mobilityeng
dc.titleCharge carrier density, mobility, and Seebeck coefficient of melt-grown bulk ZnGa2O4 single crystalseng
dc.typeArticleeng
dc.typeTexteng
tib.accessRightsopenAccesseng
wgl.contributorIKZeng
wgl.subjectPhysikeng
wgl.typeZeitschriftenartikeleng
Files
Original bundle
Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
5.0002847.pdf
Size:
1.33 MB
Format:
Adobe Portable Document Format
Description:
Collections