Spectrophotometric and ellipsometric measurements on coated flat glass Report of the International Commission on Glass Technical Committee 19 "Physical Methods for Studying Glass Surfaces"

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dc.bibliographicCitation.firstPage326
dc.bibliographicCitation.journalTitleGlastechnische Berichte
dc.bibliographicCitation.lastPage332
dc.bibliographicCitation.volume61
dc.contributor.authorAnderson, C.
dc.contributor.authorWuest, I.
dc.contributor.authorDella Mea, G.
dc.contributor.authorEmiliani, G.
dc.contributor.authorKawahara, H.
dc.contributor.authorMazzoldi, P.
dc.contributor.authorNoshiro, M.
dc.contributor.authorPolato, P.
dc.date.accessioned2024-08-29T07:36:18Z
dc.date.available2024-08-29T07:36:18Z
dc.date.issued1988
dc.description.abstractThe deposition technology of thin films on flat glass is used for optimizing the behaviour of glazings as regards natural daylighting, solar control and thermal insulation. The characterization of the modified glass surface is of great importance to predict this behaviour. In 1986 the International Commission on Glass (ICG) decided to commit the task of glass surface characterization to its Technical Committee TC 19. Three coated samples were circulated among the members of TC 19 and the coatings were characterized with different techniques. This paper reports the results obtained with optical methods.ger
dc.description.versionpublishedVersion
dc.identifier.urihttps://oa.tib.eu/renate/handle/123456789/15244
dc.identifier.urihttps://doi.org/10.34657/14266
dc.language.isoeng
dc.publisherOffenbach : Verlag der Deutschen Glastechnischen Gesellschaft
dc.relation.issn0017-1085
dc.rights.licenseCC BY 3.0 DE
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/de/
dc.subject.ddc660
dc.titleSpectrophotometric and ellipsometric measurements on coated flat glass Report of the International Commission on Glass Technical Committee 19 "Physical Methods for Studying Glass Surfaces"ger
dc.typeArticle
dc.typeText
tib.accessRightsopenAccess
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