Nanoscale mechanical surface properties of single crystalline martensitic Ni-Mn-Ga ferromagnetic shape memory alloys

Located beyond the resolution limit of nanoindentation, contact resonance atomic force microscopy (CR-AFM) is employed for nano-mechanical surface characterization of single crystalline 14M modulated martensitic Ni-Mn-Ga (NMG) thin films grown by magnetron sputter deposition on (001) MgO substrates. Comparing experimental indentation moduli-obtained with CR-AFM-with theoretical predictions based on density functional theory (DFT) indicates the central role of pseudo plasticity and inter-martensitic phase transitions. Spatially highly resolved mechanical imaging enables the visualization of twin boundaries and allows for the assessment of their impact on mechanical behavior at the nanoscale. The CR-AFM technique is also briefly reviewed. Its advantages and drawbacks are carefully addressed.

Keywords

Contact resonance, Density functional theories (DFT), Ferromagnetic shape memory alloy, Magnetron sputter deposition, Mechanical behavior, Mechanical imaging, Mechanical surface, MgO substrate, Nano scale, Ni-Mn-Ga, Pseudoplasticity, Resolution limits, Single-crystalline, Surface characterization, Theoretical prediction, Twin boundaries, Atomic force microscopy, Crystalline materials, Gallium, Gallium alloys, Manganese, Nanoindentation, Nanotechnology, Surface properties, Visualization, Mechanical properties

URI

https://doi.org/10.34657/4415
https://oa.tib.eu/renate/handle/123456789/5786

Citation

Jakob, A. M., Müller, M., Rauschenbach, B., & Mayr, S. G. (2012). Nanoscale mechanical surface properties of single crystalline martensitic Ni-Mn-Ga ferromagnetic shape memory alloys. 14. https://doi.org//10.1088/1367-2630/14/3/033029

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Physik

License

CC BY-NC-SA 3.0 Unported

https://creativecommons.org/licenses/by-nc-sa/3.0/

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