Kelvin probe force microscopy of charged indentation-induced dislocation structures in KBr

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Date
2009
Volume
2008
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Saarbrücken : Leibniz-Institut für neue Materialien
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Abstract

The incipient stages of plasticity in KBr single crystals have been examined in ultrahigh vacuum by means of Atomic Force Microscopy and Kelvin Probe Force Microscopy (KPFM). Conducting diamond-coated tips have been used to both indent the crystals and image the resulting plastic deformation. KPFM reveals that edge dislocations intersecting the surface carry a negative charge similar to kinks in surface steps, while screw dislocations show no contrast. Weak topographic features extending in <110> direction from the indentation are identified by atomic-resolution imaging to be pairs of edge dislocations of opposite sign, separated by a distance similar to the indenter radius. They indicate the glide of two parallel {110} planes perpendicular to the surface, a process that allows for a slice of KBr to be pushed away from the indentation site.

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Egberts, P., & Bennewitz, R. (2009). Kelvin probe force microscopy of charged indentation-induced dislocation structures in KBr. 2008.
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