Successful optimization of reconstruction parameters in structured illumination microscopy

Abstract

The impact of the different reconstruction parameters in super-resolution structured illumination microscopy (SIM) on image artifacts is carefully analyzed. These parameters comprise the Wiener filter parameter, an apodization function, zero-frequency suppression and modifications of the optical transfer function. A detailed investigation of the reconstructed image spectrum is concluded to be suitable for identifying artifacts. For this purpose, two samples, an artificial test slide and a more realistic biological system, were used to characterize the artifact classes and their correlation with the image spectra as well as the reconstruction parameters. In addition, a guideline for efficient parameter optimization is suggested and the implementation of the parameters in selected up-to-date processing packages (proprietary and open-source) is depicted. © 2018 The Authors

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Citation
Karras, C., Smedh, M., Förster, R., Deschout, H., Fernandez-Rodriguez, J., & Heintzmann, R. (2019). Successful optimization of reconstruction parameters in structured illumination microscopy (Amsterdam [u.a.] : Elsevier). Amsterdam [u.a.] : Elsevier. https://doi.org//10.1016/j.optcom.2018.12.005
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CC BY-NC-ND 4.0 Unported