Modulation Linearity Characterization of Si Ring Modulators

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Modulation_Linearity_Characterization.pdf(5.36 MB)
Date
2021
Authors
Volume
39
Issue
24
Journal
Series Titel
Book Title
Publisher
Washington, DC : OSA
Link to publishers version
https://doi.org/10.1109/JLT.2021.3093463
Abstract

Modulation linearity of Si ring modulators (RMs) is investigated through the numerical simulation based on the coupled-mode theory and experimental verification. Numerical values of the key parameters needed for the simulation are experimentally extracted. Simulation and measurement results agree well. With these, the influence of input optical wavelength and power on the Si RM linearity are characterized.

Description
Keywords
Linearity, microwave photonics, Modulation, modulation linearity, Nonlinear optics, Optical filters, Optical modulation, Si ring modulator, Silicon, Voltage measurement
URI
https://oa.tib.eu/renate/handle/123456789/8306
 https://doi.org/10.34657/7344
Citation
Jo, Y., Mai, C., Lischke, S., Zimmermann, L., & Choi, W.-Y. (2021). Modulation Linearity Characterization of Si Ring Modulators. 39(24). https://doi.org//10.1109/JLT.2021.3093463
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Physik
License
CC BY 4.0 Unported
https://creativecommons.org/licenses/by/4.0/