Exciton emission of quasi-2D InGaN in GaN matrix grown by molecular beam epitaxy

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Date
2017
Volume
7
Issue
1
Journal
Scientific Reports
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[London] : Macmillan Publishers Limited
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Abstract

We investigate the emission from confined excitons in the structure of a single-monolayer-thick quasi-two-dimensional (quasi-2D) Inx Ga1-x N layer inserted in GaN matrix. This quasi-2D InGaN layer was successfully achieved by molecular beam epitaxy (MBE), and an excellent in-plane uniformity in this layer was confirmed by cathodoluminescence mapping study. The carrier dynamics have also been investigated by time-resolved and excitation-power-dependent photoluminescence, proving that the recombination occurs via confined excitons within the ultrathin quasi-2D InGaN layer even at high temperature up to ∼220 K due to the enhanced exciton binding energy. This work indicates that such structure affords an interesting opportunity for developing high-performance photonic devices.

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Ma, D., Rong, X., Zheng, X., Wang, W., Wang, P., Schulz, T., et al. (2017). Exciton emission of quasi-2D InGaN in GaN matrix grown by molecular beam epitaxy ([London] : Macmillan Publishers Limited). [London] : Macmillan Publishers Limited. https://doi.org//10.1038/srep46420
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CC BY 4.0 Unported