Exciton emission of quasi-2D InGaN in GaN matrix grown by molecular beam epitaxy

Abstract

We investigate the emission from confined excitons in the structure of a single-monolayer-thick quasi-two-dimensional (quasi-2D) Inx Ga1-x N layer inserted in GaN matrix. This quasi-2D InGaN layer was successfully achieved by molecular beam epitaxy (MBE), and an excellent in-plane uniformity in this layer was confirmed by cathodoluminescence mapping study. The carrier dynamics have also been investigated by time-resolved and excitation-power-dependent photoluminescence, proving that the recombination occurs via confined excitons within the ultrathin quasi-2D InGaN layer even at high temperature up to ∼220 K due to the enhanced exciton binding energy. This work indicates that such structure affords an interesting opportunity for developing high-performance photonic devices.

Description
Keywords
chemical binding, excitation, high temperature, photoluminescence
Citation
Ma, D., Rong, X., Zheng, X., Wang, W., Wang, P., Schulz, T., et al. (2017). Exciton emission of quasi-2D InGaN in GaN matrix grown by molecular beam epitaxy. 7(1). https://doi.org//10.1038/srep46420
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License
CC BY 4.0 Unported