Redox equilibria of polyvalent elements in binary Na2O · xSiO2 melts

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Date
2000
Volume
73
Issue
Journal
Glass Science and Technology
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Publisher
Offenbach : Verlag der Deutschen Glastechnischen Gesellschaft
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Abstract

Glass melts with the basic compositions (in mol%) of 15 Na2O ∙ 85 SiO2 and Na2O ∙ 2 SiO2 were doped with oxides of various polyvalent elements. At temperatures in the range of 800 to 1550°C, square-wave voltammograms were recorded, which exhibit distinct maxima attributed to respective reduction processes. The following redox steps were observed: Sb5+/Sb3+, Sb3+/Sb0, As5+/As3+, As3+/As0, Cu+/Cu0, V5+/V4+, V4+/V3+, Cr6+/Cr3+, Cr3+/Cr2+, Fe3+/Fe2+ and Ti4+/Ti3+. Peak potentials measured in the Na2O ∙ 2 SiO2 glass depended linearly on temperature, while those of the 15 Na2O ∙ 85 SiO2 melt were affected by the crystallization of cristobalit at temperatures < 1300°C. Redox equilibria in the alkali-rich Na2O ∙ 2 SiO2 melt were generally shifted to the oxidized state by comparison to those measured in the 15 Na2O ∙ 85 SiO2 melt.

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Citation
Gönna, G. v. d., & Rüssel, C. (2000). Redox equilibria of polyvalent elements in binary Na2O · xSiO2 melts. Offenbach : Verlag der Deutschen Glastechnischen Gesellschaft.
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CC BY 3.0 DE